Signal reading circuit, its control method and pulse detector

Abstract

A signal reading circuit and a control method thereof and a pulse detector are provided. The signal reading circuit comprises a first transistor, a second transistor, an amplifier and a resistor. A first end of the first transistor is used to receive a first base voltage. A second end of the first transistor is electrically coupled with a first node. A control end of the first transistor is used to receive a first reference voltage. A first end of the second transistor is electrically coupled with the first node. A second end of the second transistor is used to receive a second reference voltage. A control end of the second transistor is used to receive an input voltage. The amplifier comprises a first input end, a second input end and an output end. The first input end is electrically coupled with the first node. The second input end is used to receive the second reference voltage. An end of the resistor is electrically coupled with the first input end of the amplifier. The other end of the resistor is electrically coupled with an output end of the amplifier. The invention also discloses a control method of the signal reading circuit and a pulse detector with the signal reading circuit.

Description

technical field [0001] The invention relates to a signal reading circuit and a control method thereof, in particular to a signal reading circuit of a sensing element and a control method thereof and a pulse detector with the signal reading circuit. Background technique [0002] With the help of the signal reading circuit, analog signals such as optical signals, thermal signals, or biomedical signals can be properly gained or compensated for subsequent analysis and processing by the user. It is even possible to properly sample the analog signal to form a discrete signal or a digital signal, so as to facilitate digital signal processing for users. [0003] In the system, the performance of each block circuit is often regarded as consistent with the standard specification. However, in the actual circuit, the components of each part of the circuit will often degrade to varying degrees according to their physical characteristics under extreme environments or after a long period ...

AI Technical Summary

Problems solved by technology

[0004] The technical problem to be solved by the present invention is to provide a signal reading circuit and its control method, so as to overcome the problem of parameter drift caused by transistor deterioration and make the output of the signal reading circuit inaccurate

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