A kind of deposition method of silicon nitride thin film
A technology of silicon nitride film and deposition method, which is applied in the direction of final product manufacturing, circuit, climate sustainability, etc., can solve the problems of unsatisfactory hydrogen passivation effect and low conversion efficiency of cells, and achieve the goal of improving surface cleanliness Effect
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Embodiment 1
[0053] A method for depositing a silicon nitride film, the method adopts plate-type plasma-enhanced chemical vapor deposition equipment for hydrogen passivation. Before hydrogen passivation, remove the heating plate in the feeding chamber, and clean it thoroughly with a dust-free cloth dipped in alcohol; fix the silicon wafer on the graphite frame; the silicon wafer enters the feeding chamber, and when the silicon wafer is still Raise the temperature of the feed chamber from 20°C at a rate of 10°C / s to 15°C / s °C / s, and fill the surface of the silicon wafer with nitrogen gas during the process of the silicon wafer being stationary and heating up, and the nitrogen gas flow rate is 800 sccm , when the maximum temperature of the feeding chamber is 250°C, move the silicon wafer into the preheating chamber, the temperature of the preheating chamber is 250°C when moving in, and the preheating rate is 8°C / s~10°C / s°C / s The temperature of the chamber is raised. After the silicon wafer m...
Embodiment 2
[0057] A method for depositing a silicon nitride film, the method adopts plate-type plasma-enhanced chemical vapor deposition equipment for hydrogen passivation. Before hydrogen passivation, remove the heating plate in the feeding chamber, and clean it thoroughly with a dust-free cloth dipped in alcohol; fix the silicon wafer on the graphite frame; the silicon wafer enters the feeding chamber, and when the silicon wafer is still Raise the temperature of the feed chamber from 20°C at a rate of 10°C / s to 15°C / s, and fill the surface of the silicon wafer with nitrogen gas during the process of the silicon wafer being stationary and heating up, with a nitrogen flow rate of 1000 sccm. When the maximum temperature of the feeding chamber is 250°C, move the silicon wafer into the preheating chamber. When moving in, the temperature of the preheating chamber is 250°C. After moving for 8s, leave the preheating chamber and enter the process chamber. The temperature of the process chamber ...
Embodiment 3
[0061]A method for depositing a silicon nitride film, the method adopts plate-type plasma-enhanced chemical vapor deposition equipment for hydrogen passivation. Before hydrogen passivation, remove the heating plate in the feeding chamber, and clean it thoroughly with a dust-free cloth dipped in alcohol; fix the silicon wafer on the graphite frame; the silicon wafer enters the feeding chamber, when the silicon wafer is still The temperature of the feed chamber is raised from 50°C at a rate of 8°C / s to 10°C / s, and nitrogen is filled on the surface of the silicon wafer while the silicon wafer is still and the temperature is rising. The nitrogen flow rate is 700 sccm. When the maximum temperature of the feed material reaches 250°C, move the silicon wafer into the preheating chamber. When moving in, the temperature of the preheating chamber is 250°C. After moving in the chamber for 8s, leave the preheating chamber and enter the process chamber. When entering, the temperature of the...
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