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A kind of deposition method of silicon nitride thin film

A technology of silicon nitride film and deposition method, which is applied in the direction of final product manufacturing, circuit, climate sustainability, etc., can solve the problems of unsatisfactory hydrogen passivation effect and low conversion efficiency of cells, and achieve the goal of improving surface cleanliness Effect

Active Publication Date: 2019-05-24
CSI CELLS CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In the existing PECVD machine, the temperature change curve of the silicon wafer in the process flow with time can be found in figure 1 , the specific process flow is: the silicon wafer is fixed on the graphite frame, and then passes through the preheating chamber, the process chamber, the cooling chamber and the discharge chamber in sequence. Usually, the main function of the preheating chamber is to preheat the silicon wafer, so that Before the silicon nitride is deposited on the silicon wafer, the silicon wafer has a certain temperature. However, the hydrogen passivation effect achieved by the silicon nitride thin film deposition method in the prior art is not ideal, which further leads to a low conversion efficiency of the cell. It needs to be further improved to meet the needs of practical applications

Method used

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  • A kind of deposition method of silicon nitride thin film
  • A kind of deposition method of silicon nitride thin film
  • A kind of deposition method of silicon nitride thin film

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Embodiment 1

[0053] A method for depositing a silicon nitride film, the method adopts plate-type plasma-enhanced chemical vapor deposition equipment for hydrogen passivation. Before hydrogen passivation, remove the heating plate in the feeding chamber, and clean it thoroughly with a dust-free cloth dipped in alcohol; fix the silicon wafer on the graphite frame; the silicon wafer enters the feeding chamber, and when the silicon wafer is still Raise the temperature of the feed chamber from 20°C at a rate of 10°C / s to 15°C / s °C / s, and fill the surface of the silicon wafer with nitrogen gas during the process of the silicon wafer being stationary and heating up, and the nitrogen gas flow rate is 800 sccm , when the maximum temperature of the feeding chamber is 250°C, move the silicon wafer into the preheating chamber, the temperature of the preheating chamber is 250°C when moving in, and the preheating rate is 8°C / s~10°C / s°C / s The temperature of the chamber is raised. After the silicon wafer m...

Embodiment 2

[0057] A method for depositing a silicon nitride film, the method adopts plate-type plasma-enhanced chemical vapor deposition equipment for hydrogen passivation. Before hydrogen passivation, remove the heating plate in the feeding chamber, and clean it thoroughly with a dust-free cloth dipped in alcohol; fix the silicon wafer on the graphite frame; the silicon wafer enters the feeding chamber, and when the silicon wafer is still Raise the temperature of the feed chamber from 20°C at a rate of 10°C / s to 15°C / s, and fill the surface of the silicon wafer with nitrogen gas during the process of the silicon wafer being stationary and heating up, with a nitrogen flow rate of 1000 sccm. When the maximum temperature of the feeding chamber is 250°C, move the silicon wafer into the preheating chamber. When moving in, the temperature of the preheating chamber is 250°C. After moving for 8s, leave the preheating chamber and enter the process chamber. The temperature of the process chamber ...

Embodiment 3

[0061]A method for depositing a silicon nitride film, the method adopts plate-type plasma-enhanced chemical vapor deposition equipment for hydrogen passivation. Before hydrogen passivation, remove the heating plate in the feeding chamber, and clean it thoroughly with a dust-free cloth dipped in alcohol; fix the silicon wafer on the graphite frame; the silicon wafer enters the feeding chamber, when the silicon wafer is still The temperature of the feed chamber is raised from 50°C at a rate of 8°C / s to 10°C / s, and nitrogen is filled on the surface of the silicon wafer while the silicon wafer is still and the temperature is rising. The nitrogen flow rate is 700 sccm. When the maximum temperature of the feed material reaches 250°C, move the silicon wafer into the preheating chamber. When moving in, the temperature of the preheating chamber is 250°C. After moving in the chamber for 8s, leave the preheating chamber and enter the process chamber. When entering, the temperature of the...

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Abstract

The invention discloses a deposition method of a silicon nitride thin film. According to the method, a plasma enhanced chemical vapor deposition device is adopted to deposit the silicon nitride thin film. In a deposition process, a silicon wafer sequentially passes through a feed chamber, a pre-heating chamber, a process chamber, a cooling chamber and a discharging chamber; the temperature of the feed chamber, pre-heating chamber and process chamber rises with time; the lowest temperature of the feed chamber, the highest temperature of the feed chamber, the lowest temperature of the pre-heating chamber, the highest temperature of the pre-heating chamber, the lowest temperature of the process chamber and the highest temperature of the process chamber are recoded as T1, T1', T2, T2', T3 and T3' respectively, wherein T1' ranges from 200 DEG C to 250 DEG C, and T2 is equal to T1'; and the temperature of the pre-heating chamber when the silicon wafer leaves the pre-heating chamber is the same as the temperature of the process chamber when the silicon wafer enters the process chamber, after the silicon wafer enters the process chamber, the temperature of the process chamber rises to T3'. With the deposition method of the invention adopted, power output and the cracking probability of the silicon wafer are decreased, a hydrogen passivation effect is enhanced, and the efficiency (EFF) of an obtained solar cell is improved by 0.08% compared with that of a product in prior art, and open-circuit voltage (Uoc) and short-circuit current (Isc) are also improved.

Description

technical field [0001] The invention belongs to the field of solar cell manufacturing, and relates to a deposition method of a silicon nitride film, in particular to a deposition method of a silicon nitride film capable of improving the hydrogen passivation effect. Background technique [0002] Conventional fossil fuels are being exhausted day by day. Among the existing sustainable energy sources, solar energy is undoubtedly the cleanest, most common and most potential alternative energy source. Solar power generation devices, also known as solar cells or photovoltaic cells, can directly convert solar energy into electrical energy. The principle of power generation is based on the photovoltaic effect of semiconductor PN junctions. The core of the solar power generation device is the cell, most of which are currently made of silicon wafers. [0003] In the production process of photovoltaic cells, it is necessary to coat a layer of anti-reflection film on the surface of the ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/02H01L31/18
CPCH01L21/0217H01L21/02274H01L21/02299H01L31/1804H01L31/1868Y02E10/547Y02P70/50
Inventor 袁中存党继东
Owner CSI CELLS CO LTD