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Test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing and a linear time-periodic filter

A periodic filter and linear time technology, applied in digital variable display, digital variable/waveform display, instrument, etc., can solve problems such as signal-to-noise ratio degradation and inherent noise loss

Active Publication Date: 2017-03-22
TEKTRONIX INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

A significant disadvantage of this technique is the inherent noise penalty (penalty) when digitizing an arbitrary input signal whose frequency content can be routed to only one ADC channel
The recombined output will contain signal energy from only one ADC, but noise energy from all ADCs, degrading the signal-to-noise ratio (SNR)

Method used

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  • Test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing and a linear time-periodic filter
  • Test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing and a linear time-periodic filter

Examples

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Embodiment Construction

[0013] figure 1 is a block diagram of an ADC system for test and measurement instruments using harmonic mixing. In this embodiment, the instrument includes a splitter 10 configured to split an input signal 12 having a specific frequency spectrum into a plurality of split signals 14 and 16 , each split signal comprising substantially the entire spectrum of the input signal 12 . The splitter 10 may be any kind of circuit that can split the input signal 12 into a plurality of signals. For example, splitter 10 may be a resistive voltage divider. Accordingly, substantially all frequency components of the input signal 12 may be present in each of the split signals 14 and 16 . However, depending on the number of paths, harmonic signals used, etc., the frequency response for the various split signals of splitter 10 may be different.

[0014] Split signals 14 and 16 are inputs to harmonic mixers 18 and 24, respectively. Harmonic mixer 18 is configured to mix split signal 14 with ha...

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Abstract

The invention discloses a test and a measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing and a linear time-periodic filter. A test and measurement instrument, including a splitter configured to split an input signal having a particular bandwidth into a plurality of split signals, each split signal including substantially the entire bandwidth of the input signal, a plurality of harmonic mixers, each harmonic mixer configured to mix an associated split signal of the plurality of split signals with an associated harmonic signal to generate an associated mixed signal, a plurality of digitizers, each digitizer configured to digitize a mixed signal of an associated harmonic mixer of the plurality of harmonic mixers, and a linear time-periodic filter configured to receive the digitized mixed signal from each of the digitizers and output a time-interleaved signal. A first-order harmonic of at least one harmonic signal associated with the harmonic mixers is different from a sample rate of at least one of the digitizers.

Description

technical field [0001] The present invention relates to test and measurement instruments and more particularly to test and measurement instruments including one or more asynchronous time-interleaved digitizers that use harmonic mixing for noise reduction. Background technique [0002] The available bandwidth of test and measurement instruments, such as digital oscilloscopes, can be limited by the analog-to-digital converter (ADC) used to digitize the input signal. The available bandwidth of the ADC can be limited to the lesser of half the maximum sampling rate of the ADC or the analog bandwidth. Various techniques have been developed to digitize higher bandwidth signals using existing ADCs. [0003] For example, synchronous time interleaving can be used to achieve effectively higher sampling rates. Multiple ADCs can sample the input signal offset in time within a single sampling period. The digitized outputs can be combined together for effectively doubling the sampling r...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R13/02
CPCG01R13/0209G01R13/0236G01R13/0272G01R19/2506H03M1/121H03M1/1215
Inventor D.G.克尼林
Owner TEKTRONIX INC