A test circuit used in high-voltage AC circuit breaker test modes t10 and t30 and its configuration method

Abstract

The invention discloses a test loop used in high-voltage AC circuit breaker test means T10 and T30 and a configuration method thereof. The test loop comprises a second TRV regulating loop and a standard loop for test means T10 and T30, wherein the standard loop is away from a power supply side end wire outlet and is connected to the second TRV regulating loop for short-circuited connection. The configuration method includes the steps of 1, calculating the component parameters in the standard loop and the second TRV regulating loop according to standard requirements, 2, conducting loop configuration according to the component parameters obtained in the step 1 and the test loop in the invention, and 3, verifying test to obtain test parameters and test waveforms, determining whether the test parameters and waveforms meet the standard requirements, if yes, determining the loop configuration is successful and conducting related test, and if not, repeating the step 1. The test loop has the advantages of simple structure, delicate design, convenient configuration, high efficiency and being simple, and the requirements of test means of T10 and T30 in the standard on TRV parameters.

Description

technical field [0001] The invention relates to the technical field of type testing of high-voltage AC circuit breakers, in particular to a test circuit used in test modes T10 and T30 of high-voltage AC circuit breakers and a configuration method thereof. Background technique [0002] Items 4.102.3 and 6.104.5 of "GB1984-2014 High Voltage AC Circuit Breaker" are for parameters of transient recovery voltage (TRV) after short-circuit breaking (including peak U C , peak time t 3 , delay t d ) is clearly defined, especially in test methods T10 and T30, for t 3 There are higher requirements. Currently commonly used as figure 1 The standard circuit shown is for three-phase direct test T10, T30, from the figure R 1 、C 1 The first TRV regulation loop formed in series can adjust the TRV parameters, but due to the influence of the distributed capacitance of the transformer and the bus to the ground, it is difficult for this test loop to meet the small t 3 (and the corresponding...

AI Technical Summary

Problems solved by technology

Currently commonly used as figure 1 The standard circuit shown is for three-phase direct test T10, T30, from the figure R 1 、C 1 The first TRV regulation loop formed in series can adjust the TRV parameters, but due to the influence of the distributed capacitance of the transformer and the bus to the ground, it is difficult for this test loop to meet the small t 3 (and the corresponding t d ), although the minimum value that can be used is allowed in the standard, but this test parameter is too loose for product assessment

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