A Reliability Evaluation Method for Aerospace Electronic Products

Abstract

The invention discloses an evaluation method of reliability of an aerospace electronic product based on a failure mechanism. On the basis that an analysis method with a combination of physical simulation and a test is adopted, a physical simulation model of the electronic product is constructed, the means such as sensitivity analysis, Monte Carlo analysis, and stress analysis are adopted, and product key elements are identified and in combination with actual working conditions of the elements, a failure mechanism analysis is conducted. Currently, the failure mechanism analysis aiming at the elements is a means used for analyzing a failure reason after a failure occurs during the test or in the using process of the electronic product, thus pertinent improvement is conducted on the product, the service life of the product is prolonged, and the reliability of the product is improved; the failure mechanism analysis aims at finding key characteristic parameters which affect the service life and the reliability of weak elements as an independent variable of the reliability model.

Description

technical field [0001] The invention belongs to the technical field of reliability analysis and evaluation of aerospace electronic products, and in particular relates to a reliability evaluation method of aerospace electronic products based on failure mechanism. Background technique [0002] Electronic products are widely used in space and rocket products, such as stand-alone products such as power amplifiers, computers, distributors, and FM transmitters in launch vehicles; stand-alone products such as computers, circuit boxes, drivers, and temperature controllers in satellites All are electronic products. Most of these electronic products are composed of printed circuit boards (PCBs), and circuit boards are composed of different types of components, such as resistors and capacitors. [0003] Reliability, as an index that indirectly expresses the product's work and task completion ability, cannot be directly measured in the test. It needs to be obtained through the analysis...

AI Technical Summary

Problems solved by technology

In view of the characteristics of high-reliability small samples in aerospace, this method has certain limitations:

Due to the requirements of the development progress, it is almost impossible to carry out 1:1 tests on the ground

In addition, through a large number of single-level tests to verify its life and reliability, the cost of the test remains high

[0008] 2) Insufficient use of test data

[0009] Using the test information of test time and number of failures to evaluate product reliability, many key performance parameters measured in the test cannot be used in the reliability evaluation. As a result, when the test time is relatively insufficient, the evaluation results often cannot reflect Product real reliability level

[0010] 3) Insufficient relevance to the product

Therefore, under the condition that the reliability evaluation results do not meet the requirements of the indicators, targeted product improvement suggestions cannot be given. When the number of failures is large, it means that the product needs design improvement. When the number of failures is small or zero, it can only be passed. Increase the test time to improve the reliability evaluation value, resulting in waste of test cost and time

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