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SIR (Surface insulation resistance) testing system

A technology for testing insulation resistance and resistance, which is applied in the direction of measuring resistance/reactance/impedance, measuring devices, measuring electrical variables, etc. It can solve the problem of incorrect response of the relationship between voltage and resistance, interference of measurement time and measurement interval, and high labor intensity, etc. problem, achieve the effect of simplifying the repeated testing process, increasing the accuracy and reliability, and labor-intensive

Inactive Publication Date: 2017-04-26
上海极率科技有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Disadvantages: the accuracy is too low, the relationship between voltage and resistance cannot be correctly reflected, let alone long-term large-scale measurement and scientific analysis
[0009] Disadvantages: There is a certain basis for operators and users. Each time, manual measurement and manual recording of test data are required. The labor intensity is high, and there is a risk of being shocked by high voltage during the test process.
Each measurement time and measurement interval will be interfered by human factors, and 24-hour uninterrupted measurement cannot be carried out. The statistics of test data are all carried out manually
Many of the above factors have led to a decrease in the accuracy of the measurement, which is not conducive to the analysis of the experimental results.

Method used

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  • SIR (Surface insulation resistance) testing system
  • SIR (Surface insulation resistance) testing system
  • SIR (Surface insulation resistance) testing system

Examples

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Embodiment Construction

[0033] The present invention will be described in detail below in conjunction with specific embodiments. The following examples will help those skilled in the art to further understand the present invention, but do not limit the present invention in any form. It should be noted that those skilled in the art can make several changes and improvements without departing from the concept of the present invention. These all belong to the protection scope of the present invention.

[0034]With the increase of business volume and continuous improvement of testing requirements, ion migration evaluation and insulation evaluation are becoming more and more important. Relying solely on manual testing can no longer meet the testing needs of today's miniaturized and high-density electronic equipment. How to develop a new surface insulation resistance testing system based on existing testing requirements and quickly and accurately complete the automated testing of surface insulation resista...

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Abstract

The invention provides an SIR testing system, comprising a control box; a programmable high voltage power supply in connection with the control box to provide power supply to the control box; an industrial personal computer in connection with the programmable high voltage power supply to control the programmable high voltage power supply; a programmable switch in connection with the control box to realize the switching among a plurality of testing channels; a switchboard connected with the control box, the industrial personal computer and the programmable switch respectively to provide a signal channel; an externally provided box in connection with the programmable switch; an environmental test chamber in connection with the industrial personal computer and an ammeter in connection with the control box to measure. Compared with the prior art, the testing system of the invention has the following advantages: 1) simplifying repetitive testing procedures; 2) avoiding errors of manual measurement; and 3) conducting more advanced data analysis.

Description

technical field [0001] The invention relates to the technical field of semiconductor printed circuit boards, in particular to an SIR insulation resistance testing system for evaluating ion migration characteristics of various insulating materials. Background technique [0002] With the rapid development of semiconductor materials and printed circuit boards, test and measurement equipment for evaluating the surface insulation resistance of the measured object was invented. Potential problems with assemblies. These failures can be caused by material interactions, inadequate process control, or poor material properties. Sheet resistance, conductivity, and leakage of electrolytic contaminants are all factors that affect insulation resistance. Based on the insulation resistance test method, different measured objects are different, and there are safety problems in the use of electricity, in electrical equipment, such as motors, cables, household appliances, etc. One of their n...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R27/08
Inventor 洪健徐航张辉寇红兵黄媛
Owner 上海极率科技有限公司
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