X-ray absorption measurement system

Abstract

This disclosure presents systems for x-ray absorption fine structure (XAFS) measurements that have x-ray flux and flux density several orders of magnitude greater than existing compact systems; for applications of x-ray absorption near-edge spectroscopy (XANES) or extended x-ray fine absorption structure (EXFAS) spectroscopy. The higher brightness is achieved using designs for x-ray targets that comprise aligned microstructures of x-ray generating materials fabricated in close thermal contact with a substrate having high thermal conductivity. This allows for bombardment with higher electron density and / or higher energy electrons, leading to greater x-ray brightness and high flux. The high brightness x-ray source is coupled to an x-ray reflecting optical system to collimate the x-rays, and a monochromator, which selects the exposure energy. Absorption spectra of samples using the high flux monochromatic x-rays can be made using standard detection techniques.

Description

[0001] Cross References to Related Applications [0002] This patent application claims U.S. Provisional Patent Application No. 62 / 008,856 filed on June 6, 2014 and U.S. Provisional Patent Application No. 62 / 086,132 filed on December 1, 2014 and Priority and benefit of US Provisional Patent Application No. 62 / 117,062, all of which are incorporated herein by reference in their entirety. This application also claims priority to and the benefit of US Application Serial No. 14 / 636,994, filed March 3, 2015, which is hereby incorporated by reference in its entirety. technical field [0003] The present invention relates to a technique for analyzing the chemical / electronic states of element(s) in materials using X-ray Absorption Near-Edge Spectroscopy (XANES) technique and for determining the chemical / electronic state of element(s) in materials using Extended X-ray Fine Absorption Structure (EXFAS) technique. ) high-brightness x-ray absorption spectroscopy equipment for the atomic ...

AI Technical Summary

Problems solved by technology

Although the use of curved crystals increases the angular spectral width of the x-rays generated by the source, x-ray spectrometers based on Rowland circles suffer from the following drawbacks: high x-energy resolution is difficult to obtain due to crystal strains induced by bending, requiring movement of the three main At least two of the components (source, crystal, and slit / sample) to perform energy scanning

However, this technique lacks a high-brightness compact x-ray source that can be used in the laboratory or in the field

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