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X-ray absorption measurement system

A measurement system and x-ray technology, applied in the field of high-brightness x-ray absorption spectroscopy equipment, can solve the problems of lack of x-ray source and difficulty in obtaining high x-energy resolution

Active Publication Date: 2017-04-26
SIGRAY INC
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Although the use of curved crystals increases the angular spectral width of the x-rays generated by the source, x-ray spectrometers based on Rowland circles suffer from the following drawbacks: high x-energy resolution is difficult to obtain due to crystal strains induced by bending, requiring movement of the three main At least two of the components (source, crystal, and slit / sample) to perform energy scanning
However, this technique lacks a high-brightness compact x-ray source that can be used in the laboratory or in the field

Method used

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Embodiment Construction

[0036] X-ray Absorption Spectroscopy System

[0037] image 3 An embodiment of the invention for an x-ray absorption spectroscopy system is schematically shown.

[0038] The x-ray generator 08 includes a vacuum environment (usually 10 -6 torr or better), the vacuum environment is usually maintained by sealing the vacuum chamber 20 or using active suction, and is made with sealed electrical leads 21 and 22, the high voltage from the outside of the vacuum chamber 20 from the electrical leads 21 and 22 The negative and positive terminals of the source 10 are passed to the various components inside the vacuum chamber 20 . The x-ray source 80 typically includes a bracket 30 that secures elements of the x-ray generator 08, such as the vacuum chamber 20, to the housing 50, and the housing 50 may additionally include a shielding material, such as lead, to prevent x-rays from being emitted by the source device. 80-A radiates in undesired directions. Inside the vacuum chambe...

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Abstract

This disclosure presents systems for x-ray absorption fine structure (XAFS) measurements that have x-ray flux and flux density several orders of magnitude greater than existing compact systems; for applications of x-ray absorption near-edge spectroscopy (XANES) or extended x-ray fine absorption structure (EXFAS) spectroscopy. The higher brightness is achieved using designs for x-ray targets that comprise aligned microstructures of x-ray generating materials fabricated in close thermal contact with a substrate having high thermal conductivity. This allows for bombardment with higher electron density and / or higher energy electrons, leading to greater x-ray brightness and high flux. The high brightness x-ray source is coupled to an x-ray reflecting optical system to collimate the x-rays, and a monochromator, which selects the exposure energy. Absorption spectra of samples using the high flux monochromatic x-rays can be made using standard detection techniques.

Description

[0001] Cross References to Related Applications [0002] This patent application claims U.S. Provisional Patent Application No. 62 / 008,856 filed on June 6, 2014 and U.S. Provisional Patent Application No. 62 / 086,132 filed on December 1, 2014 and Priority and benefit of US Provisional Patent Application No. 62 / 117,062, all of which are incorporated herein by reference in their entirety. This application also claims priority to and the benefit of US Application Serial No. 14 / 636,994, filed March 3, 2015, which is hereby incorporated by reference in its entirety. technical field [0003] The present invention relates to a technique for analyzing the chemical / electronic states of element(s) in materials using X-ray Absorption Near-Edge Spectroscopy (XANES) technique and for determining the chemical / electronic state of element(s) in materials using Extended X-ray Fine Absorption Structure (EXFAS) technique. ) high-brightness x-ray absorption spectroscopy equipment for the atomic ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/083G01T1/16
CPCG21K1/067H01J35/08G21K2201/062G21K2201/064H01J2235/086G01N23/085H01J35/116
Inventor 西尔维娅·贾·云·路易斯云文兵雅诺什·科瑞艾伦·弗朗西斯·里昂
Owner SIGRAY INC
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