Automatic photoresistor testing and sorting machine

Abstract

The invention discloses an automatic photoresistor testing and sorting machine. The automatic photoresistor testing and sorting machine is provided with a machine frame, a feeding mechanism and an upright conveying mechanism, wherein the feeding mechanism and the upright conveying mechanism are located on the machine frame. An annular chain is arranged on the machine frame. Clamps used for clamping photoresistors are fixed to the circumferential outer side of the annular chain in sequence. A cylinder is arranged in the position, corresponding to a discharge port of the upright conveying mechanism, of the machine frame. The head of a piston of the cylinder stretches out of a collision part making contact with movable chucks, the movable chucks are shifted to be opened, and thus the photoresistors are clamped. A detection control box is arranged on an advancing passageway of the annular chain. An illuminating system and a testing assembly are arranged in the detection control box. A fetching assembly is arranged on the machine frame and located on the portion, behind the detection control box, of the passageway. Receiving boxes used for receiving photoresistors with different grading parameters are arranged on the outer side of a feeding cylinder. According to the automatic photoresistor testing and sorting machine, a feeding system with an automatic feeding function, an automatic clamping function, an automatic detecting function and an automatic sorting function is adopted, intelligent detection for photoresistor testing and grading is achieved, and the problem of manual grading is solved fundamentally.

Description

technical field [0001] The invention belongs to the technical field of testing equipment for electronic components, and in particular relates to a photosensitive resistance testing and sorting device with a high degree of automation, which can realize fast automatic detection and automatic sorting. Background technique [0002] Test binning is an important process in the middle and late stages of photoresistor production. Since different application fields have different requirements on the relevant parameters of photoresistors, such as bright resistance and dark resistance, manufacturers must be able to accurately give the above parameter values ​​of their products to meet the specific requirements of users. The manufacturer classifies the photoresistors produced according to the user's requirements for parameters such as bright resistance and dark resistance. This is the test classification of photoresistors. [0003] At present, the test classification of domestic manufa...

AI Technical Summary

Problems solved by technology

[0003] At present, the test classification of domestic manufacturers is basically based on manual manipulation, and the disadvantages are obvious: the light intensity of the light source cannot be controlled correctly, the speed of manual classification is very slow, manual readings introduce large errors, and test data can only be recorded manually. Preservation, which greatly affects the accuracy of binning and product consistency

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