Probe reference compensation system and method
A benchmark compensation and probe technology, applied in the direction of measuring devices, instruments, etc., can solve the problems of affecting the effect of product assembly, increase costs, tilt, etc., and achieve the effect of saving processing costs, improving product quality, and saving probe time.
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[0017] In order to make the object, technical solution and advantages of the present invention clearer, various embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings. However, those of ordinary skill in the art can understand that, in each implementation manner of the present invention, many technical details are provided for readers to better understand the present application. However, even without these technical details and various changes and modifications based on the following implementation modes, the technical solution claimed in this application can also be realized.
[0018] A first embodiment of the present invention relates to a probe reference compensation system. Such as figure 1 shown. The probe reference compensation system includes a probe compensation device 1, a computing device, and a shaft machine 2. The probe compensation device 1 is connected to the computing device and the shaft machine 2...
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