Automatic testing technique applied before anti-fuse FPGA (field programmable gate array) programming

Abstract

The invention relates to an automatic testing technique applied before anti-fuse FPGA (field programmable gate array) programming. The technique can automatically test any anti-fuse FPGA before programming. The technique includes: building a testing vector library, utilizing a software way to automatically extract testing vectors from the testing vector library by a testing vector sending module, and respectively inputting the testing vectors into a circuit logic simulation excitation applying module and a circuit response verifying module at the same time for anti-fuse FPGA circuit simulation; after circuit simulation analysis and verification, inputting a tested anti-fuse FPGA chip; collecting a result output by the FPGA chip by a testing response verifying module, and comparing the result with reference testing information input in advance to automatically generate a testing report so as to realize automatic testing of the anti-fuse FPGA before programming. The whole testing process can effectively avoid a lot of manual intervention; after testing is finished, a testing result of the chip can be known by checking the testing report. By the technique, automatic testing of the anti-fuse FPGA before programming can be completely quickly, and testing efficiency of the anti-fuse FPGA chip can be improved remarkably.

Description

technical field [0001] The invention belongs to the field of integrated circuits, and relates to an automatic test technology applied before antifuse FPGA programming. Background technique [0002] After the antifuse FPGA is manufactured, it is a logic empty chip before programming, without any logic function. It needs to be programmed to make the chip have certain logic functions before it can be used. Before chip programming, it is necessary to perform functional tests on resources such as programmable logic modules and input and output modules of unprogrammed antifuse FPGA chips to ensure that the chips are free of defects. This is the so-called pre-programming test. [0003] In the antifuse FPGA development process, pre-programming testing is required in the wafer test and finished product testing stages of the circuit; after the antifuse FPGA is formed into a product, pre-programming testing is required before delivery; before the user uses the antifuse FPGA product, T...

AI Technical Summary

Problems solved by technology

The traditional pre-programming test of anti-fuse FPGA relies on manually configuring test vectors and performing functional tests on the modules to be tested one by one, which makes the test efficiency low. Moreover, with the increase of modules to be tested, the number of test combinations also increases accordingly, which is prone to test coverage low rate

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