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171 results about "Logic simulation" patented technology

Logic simulation is the use of simulation software to predict the behavior of digital circuits and hardware description languages. Simulation can be performed at varying degrees of physical abstraction, such as at the transistor level, gate level, register-transfer level (RTL), electronic system-level (ESL), or behavioral level.

Feeder automation action logic test method based on power distribution terminal service verification

ActiveCN104460346ASolve action logic verificationSolve the problem that the test requires on-site synchronous incremental testSimulator controlFault locationSynchronous controlMaster station
The invention provides a feeder automation action logic test method based on power distribution terminal service verification. Feeder automation action logic simulation verification in the normal operating states of terminals can be achieved by the adoption of terminal service verification simulating a transmitting mode. The method includes the following steps that firstly, through synchronous control of a master power distribution station, the multiple terminals on multiple feeders can simultaneously enter simulation state modes, fault simulation transmitting of the power distribution terminal on one feeder is synchronized, centralized feeder automation action logic is verified, and the problem that tests need to be synchronously added in a field is solved; master station and terminal simulation transmitting technical protocols are formulated, and the transmitting procedure that the terminals enter the simulation modes is formulated; thirdly, it is guaranteed that normal operation of the terminals is not affected by the simulation states of the terminals, and if a true fault occurs to a power distribution line in the simulation states of the terminals, actual fault information of the terminals can be transmitted to the master station in time and is not lost; the terminals in the simulation states simultaneously record the operating information of the power distribution line, and the operating information is called by the master station at any time.
Owner:JIANGSU ELECTRIC POWER COMPANY YANGZHOU POWER +2

Logic simulation method of comprehensive automation system equipment of transformer substation

ActiveCN105005658ARealize the whole operation status monitoringMaster the working principleSpecial data processing applicationsControl layerTransformer
The invention discloses a logic simulation method of the comprehensive automation system equipment of a transformer substation. The logic simulation method comprises the following steps: equipment configuration module development, simulation module library management, simulation engineering configuration/ management, simulation configuration rule examination, simulation compiling, simulation operation control, simulation energizing control and simulation monitoring. The comprehensive automation system in the transformer substation is subjected to the logic function decoupling of equipment according to a three-layer structure, forms a simulation module library capable of reconfiguring logics and implementation functions, constructs and generates a simulation target system, which is the same with a practical transformer substation, of a secondary system by construction modules, applies or imports an energizing quantity to carry out simulation operation and carries out whole-process simulation monitoring, wherein the three-layer structure comprises a station control layer, a spacing layer and a process layer. The method is favorable for quickly mastering working principles in the secondary system and equipment of the transformer substation and mastering relevant overhauling and maintaining skills, and provides a means for accident analysis and processing.
Owner:STATE GRID CORP OF CHINA +2

Provably correct storage arrays

A hardware design technique allows checking of design system language (DSL) specification of an element and schematics of large macros with embedded arrays and registers. The hardware organization reduces CPU time for logical verification by exponential order of magnitude without blowing up a verification process or logic simulation. The hardware organization consists of horizontal word level rather than bit level. A memory array cell comprises a pair of cross-coupled inverters forming a first latch for storing data. The first latch has an output connected to a read bit line. True and complement write word and bit line input to the first latch. A first set of pass gates connects between the true and complement write word and bit line inputs via gates and the input of said first latch. The first set of pass gates is responsive to a first clock via a second pass gate. A pair of cross-coupled inverters forms a second latch of a Level Sensitive Scan Design (LSSD). The second latch has output connected to an LSSD output for design verification. A second pass gate connects between the output of the first set of pass gates and the input of said first latch. The second pass gate is responsive to said first clock. A third pass gate connects between the output of said first latch and the input of said second latch. The third pass gate is responsive to a second clock. The first and second clocks are responsive to a black boxing process for incremental verification.
Owner:IBM CORP

Automatic testing technique applied before anti-fuse FPGA (field programmable gate array) programming

The invention relates to an automatic testing technique applied before anti-fuse FPGA (field programmable gate array) programming. The technique can automatically test any anti-fuse FPGA before programming. The technique includes: building a testing vector library, utilizing a software way to automatically extract testing vectors from the testing vector library by a testing vector sending module, and respectively inputting the testing vectors into a circuit logic simulation excitation applying module and a circuit response verifying module at the same time for anti-fuse FPGA circuit simulation; after circuit simulation analysis and verification, inputting a tested anti-fuse FPGA chip; collecting a result output by the FPGA chip by a testing response verifying module, and comparing the result with reference testing information input in advance to automatically generate a testing report so as to realize automatic testing of the anti-fuse FPGA before programming. The whole testing process can effectively avoid a lot of manual intervention; after testing is finished, a testing result of the chip can be known by checking the testing report. By the technique, automatic testing of the anti-fuse FPGA before programming can be completely quickly, and testing efficiency of the anti-fuse FPGA chip can be improved remarkably.
Owner:UNIV OF ELECTRONICS SCI & TECH OF CHINA
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