Statistical method and device of programmable-logic simulation test function coverage

A technology of simulation testing and statistical methods, applied in software testing/debugging, computing, error detection/correction, etc., can solve problems such as inaccurate coverage of simulation testing functions, achieve more convincing test results, and improve activity integrity The effect of strictness and rigorous testing process

Active Publication Date: 2018-03-13
CHINA TECHENERGY +1
View PDF9 Cites 13 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] In order to solve the technical problem that the coverage rate of the simulation test function in the prior art cannot be accurately obtained, the purpose of the present invention is to provide a statistical method and device for effectively improving the coverage rate of the programmable logic simulation test function, which can increase the Effectively track and monitor the coding link, and formally describe the HPD requirements (design) items, so as to intuitively reflect the functional coverage, and make the simulation test process of programmable logic more rigorous and more in line with the requirements of high reliability

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Statistical method and device of programmable-logic simulation test function coverage
  • Statistical method and device of programmable-logic simulation test function coverage
  • Statistical method and device of programmable-logic simulation test function coverage

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0037] Such as figure 1 As shown, the present embodiment provides a statistical method for the coverage rate of the programmable logic simulation test function, and the statistical method includes:

[0038]S1. Formally describe the requirements specifications, design specifications, test designs, test cases, test procedures, SVA assertions and test records in the R&D life cycle, and describe each requirement item, design item, and test item according to predetermined coding rules , test cases, test procedures, SVA assertions and test records to establish a unique number. Ensure that all requirements items will not be missed during the design and testing process, and at the same time ensure that the code implementation stage does not generate redundant logic that is not related to system requirements.

[0039] S2, through formal description, and according to the predetermined coding rules, establish a traceability matrix between each requirement item, design item, test item, t...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention belongs to the technical field of safety level instrument control system simulation tests, aims to solve the technical problem that simulation test function coverage in the prior art cannot be accurately obtained, and provides a statistical method and device which can effectively increase programmable-logic simulation test function coverage. The statistical method includes: S1, carrying out formalized description on demand items in an HPD (HDL (hardware description language)-programmed device) demand specification book, and establishing a unique number for each demand item according to a predetermined coding rule; S2, establishing a tracking matrix of a to-be-tested system; S3, writing SVA (System Verilog Assertion) code corresponding to each test passing criterion in test regulations; and S4, automatically generating a test result through SVA after execution is completed according to test excitation corresponding to test cases. The function coverage can be visually represented through adding effective tracking and monitoring on a coding link in a simulation test process, and the simulation test process of programmable logic is enabled to be more rigorous and more accord with a requirement of high reliability.

Description

technical field [0001] The invention relates to the technical field of simulation testing of safety-level instrumentation and control systems, in particular to a statistical method and device for the coverage rate of programmable logic simulation testing functions. Background technique [0002] In some industries that require high reliability and safety, such as nuclear, military, aerospace and other fields, the integrity and reliability of the test are very important. In the prior art, the usual statistical method is to itemize requirements, design, testing and other links, and establish a top-down tracking relationship to ensure the consistency from requirements to final deliverables. [0003] For example, HPD (the abbreviation of HDL-programmed device, that is, HDL programmable device; and HDL is the abbreviation of hardware description language, translated into Chinese as hardware description language) white box verification methods mainly include simulation testing and ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
CPCG06F11/3624G06F11/3676G06F11/3684G06F11/3692
Inventor 吴飞江国进孙永滨白涛黄君龙曹宗生冀建伟齐敏吕秀红郄永学董玲玲
Owner CHINA TECHENERGY
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products