A test module of digital-analog hybrid integrated circuit

Abstract

The invention relates to a test module for a digital-analog hybrid integrated circuit and belongs to the field of semiconductor digital-analog hybrid integrated circuit testability design. Without influencing the basic functions of the circuit and with limited number of pins, a mode control unit, an input pin multiplexing unit, an output pin multiplexing unit, and a DAC data bypass unit are provided in order to solve great difficulty and incomprehensive testing of conventional digital-analog hybrid integrated circuit testing design. The test module can improve the flexibility of the testing design of the digital-analog hybrid integrated circuit with low design complexity and design time cost, realizes fast fault positioning and ensures the validity and completeness of chip testing.

Description

technical field [0001] The invention relates to a test module of a digital-analog hybrid integrated circuit, which belongs to the field of testability design of a semiconductor digital-analog hybrid integrated circuit, and is mainly used for the test design of a semiconductor digital-analog hybrid integrated circuit with a limited number of pins. Background technique [0002] With the continuous advancement of integrated circuit design methods and process technology, various problems in the design and manufacturing process have led to increasing difficulty and cost of chip testing, and testability issues have become an important issue in improving product reliability and yield a factor that cannot be ignored. The cost of testing increases sharply, and the traditional testing method becomes incompetent. [0003] In recent years, the rapid prosperity and development of the integrated circuit industry has led to higher and higher requirements for the functional density of the ...

AI Technical Summary

Problems solved by technology

[0005] (1) The controllability and observability of digital-analog hybrid integrated circuits are not high

For example, the output signal of the ADC is the input of the digital logic, and the response of the ADC cannot be directly observed through the external output IO pin, so it is difficult to realize the observability of the ADC logic and its previous analog circuit.

The input signal of DAC comes from the output of digital logic and cannot be stimulated by external input IO pins, so the controllability of DAC logic and its subsequent analog circuits is very low.

Generally speaking, the accessibility of digital / analog devices of the circuit becomes very low, which increases the difficulty of testing and makes it difficult to improve the coverage of testing

[0006] (2) Cannot locate the fault location

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