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A method, device and system for calibrating parameters of an X-ray machine

A technology of parameter calibration and X-ray machine, which is applied in the field of signal processing, can solve problems such as calibration and correction of system motion errors, and achieve the effect of improving quality

Active Publication Date: 2019-12-06
SHENZHEN INST OF ADVANCED TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In the process of realizing the present invention, the inventor found that the existing technology has the following defects: the traditional method of calibrating the system structure parameters is based on the difference between the system parameters and the design target in the static state, and cannot Calibrate and correct errors generated by system motion

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  • A method, device and system for calibrating parameters of an X-ray machine
  • A method, device and system for calibrating parameters of an X-ray machine
  • A method, device and system for calibrating parameters of an X-ray machine

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Embodiment 1

[0046] figure 1 It is a flow chart of a parameter calibration method for an X-ray machine provided in Embodiment 1 of the present invention. The method of this embodiment can be applied to the situation of calibrating the error generated during the rotation of the rotating arm of the X-ray machine. The method can be executed by a parameter calibration device of an X-ray machine, which can be realized by software and / or hardware, and can generally be integrated in an X-ray machine. Such as figure 1 As shown, the method of this embodiment specifically includes:

[0047] S110. Control the rotating arm of the X-ray machine to rotate and scan around the standard phantom, and acquire calibration scan images at multiple set rotation positions.

[0048]The standard phantom refers to a pre-constructed substitute of the actual scanning object whose shape conforms to the set rules, and is used to calibrate the amount of error generated during the actual movement of the X-ray machine. ...

Embodiment 2

[0061] Figure 2a It is a flow chart of a parameter calibration method for an X-ray machine provided in Embodiment 2 of the present invention. This embodiment is optimized based on the above-mentioned embodiment. In this embodiment, the standard phantom is optimized as a spherical phantom, and The standard phantom includes two orthogonally aligned through holes along the diameter direction. Correspondingly, the rotating arm of the X-ray machine is controlled to rotate and scan around the standard phantom to obtain calibration scan images at multiple rotational positions. Before, it was added: determine that the projection position of the X-ray light source of the X-ray machine in the detector is located at the center of the detector, and the spherical center of the standard phantom is located at the design rotation center of the X-ray machine rotating arm The operation on the above; further optimize the error parameter as: under the different mechanical structure motion states...

Embodiment 3

[0080] Figure 3a It is a flowchart of a parameter calibration method for an X-ray machine provided by Embodiment 3 of the present invention. This embodiment is optimized based on the above embodiments. In this embodiment, the standard phantom is further optimized as follows: One of the alignment through holes of the standard phantom is equidistant from the center of the sphere and each has a marked through hole perpendicular to the plane where the two alignment through holes are located. At the same time, the movement state of the mechanical structure of the rotating arm also includes: the operation of recording the rotation angle of the rotating arm at different set rotation positions; further optimizing the error parameter as: in different mechanical positions of the rotating arm Acquisition angle in the state of structure motion, and based on the type of the error parameter, the calculation process of the error parameter is given. Correspondingly, the method in this embod...

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Abstract

An embodiment of the invention discloses a method, a device and a system for calibrating parameters of X-ray machines. The method includes carrying out rotational scanning by the aid of rotary arms of the X-ray machines around standard phantoms under the control and acquiring calibration scanned images of a plurality of set rotation locations; recording mechanical structural movement states of the rotary arms at the different set rotation locations; calibrating error parameters of the rotary arms in the different mechanical structural movement states according to projection results of the standard phantoms in the calibration scanned images at the different set rotation locations; generating dynamic correction matrixes according to calibration results of the error parameters and the mechanical structural movement states of the rotary arms. The dynamic correction matrixes are used for correcting actual scanned images of the X-ray machines. According to the technical scheme, the method, the device and the system have the advantages that the error parameters generated during movement of the X-ray machines can be calibrated, and novel thinking can be provided for calibrating the parameters of the X-ray machines; the actual scanned images can be corrected by the aid of the calibration results of the error parameters, and accordingly the quality of three-dimensionally reconstructed images can be improved.

Description

technical field [0001] Embodiments of the present invention relate to signal processing technology, and in particular to a method, device and system for calibrating parameters of an X-ray machine. Background technique [0002] In X-ray three-dimensional image reconstruction, whether the running trajectory of the C-arm light source and the detector conforms to the preset trajectory directly affects the quality of the reconstructed image. The shaking of the mechanical structure during the operation of the C-arm system will change important parameters such as the distance from the ray source to the detector, the distance from the ray source to the rotation center, and the position of the rotation center, resulting in zooming or translation of the projected image; or The case where the projection acquisition angle is different from the preset angle will eventually lead to artifacts in the reconstructed image, which seriously affects the quality of image reconstruction. The lack...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): A61B6/00
CPCA61B6/583
Inventor 陈垦王澄秦文健熊璟谢耀钦
Owner SHENZHEN INST OF ADVANCED TECH