Random parameter structure reliability evaluation method based on point collocation algorithm

A technology of random parameters and reliability, applied in random CAD, calculation, electrical digital data processing, etc., can solve the problems of large calculation cost, less use, consumption, etc., to reduce model uncertainty, improve calculation accuracy and calculation efficiency Effect

Inactive Publication Date: 2017-06-13
SHENYANG AEROSPACE UNIVERSITY +1
View PDF0 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The theoretical basis of the Monte Carlo simulation method is the large number theorem in probability theory, which has the advantage of not being limited by the scope of application, but its disadvantage is that it needs to consume a huge calculation cost. Although various improved sampling methods have appeare

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Random parameter structure reliability evaluation method based on point collocation algorithm
  • Random parameter structure reliability evaluation method based on point collocation algorithm
  • Random parameter structure reliability evaluation method based on point collocation algorithm

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0030] The specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. The following examples are used to illustrate the present invention, but are not intended to limit the scope of the present invention.

[0031] A random parameter structure reliability assessment method based on collocation algorithm, such as figure 1 As shown, the method of this embodiment is as follows.

[0032] Step 1: Establish parameterized structure-function functions.

[0033] Random variables in engineering structures include material properties, environmental parameters, model errors, cognitive abilities, etc. For engineering structure design problems involving multiple independent random variables, the structure-function function is defined as

[0034] X=g(h)=g(h 1 ,... h N ) (1)

[0035] In the formula, i=1,...N, N is a positive integer, and Ω is a convex domain formed by a hypercuboid. A...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention provides a random parameter structure reliability evaluation method based on a point collocation algorithm and relates to the technical field of engineering structure reliability analysis. The method includes steps: for an engineering structure design problem having multiple independent random variables, building a structure performance function containing random parameters; building an equivalent weak form of integration of the structure performance function to acquire a unitary substitution equation of a real structure performance function; determining structure performance function statistics including average value, variance and similar expressions of high-order original moment and central moment; performing point collocation in a random variable definition domain, and determining a point collocation scheme; determining structure failure probability to evaluate structure reliability. The method takes balance between calculation accuracy and calculation efficiency of the engineering structure reliability problem into comprehensive consideration, and the structure failure probability is given out on the basis of a unitary equivalent integration weak form of the structure performance function and a point collocation method, so that model errors caused by normal assumption of random response are reduced.

Description

technical field [0001] The invention relates to the technical field of engineering structure reliability analysis, in particular to a random parameter structure reliability evaluation method based on collocation algorithm. Background technique [0002] Engineering structure design needs to ensure that the structure completes the predetermined function within the specified time and under the given load. However, there are often a large number of uncertainties in the design process and actual operating environment, which can be roughly divided into physical uncertainties, statistical uncertainties and model uncertainties. Physical uncertainties are caused by variability in parameters such as loads, materials, geometry, and boundary conditions. Statistical uncertainty is caused by the estimated deviation of the distribution parameters due to insufficient sample size, and is often caused by the deviation between the true distribution form and the estimated distribution form. M...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G06F17/50
CPCG06F30/13G06F2111/08
Inventor 祁武超王晓军
Owner SHENYANG AEROSPACE UNIVERSITY
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap