Infrared interferogram reconstruction method

An interferogram and infrared technology, applied in interferometric spectroscopy, spectrum investigation, etc., can solve the problems of low sampling frequency, increase the complexity of instrument structure, high requirements for instruments and hardware, reduce complexity, ensure time consistency, The effect of simplified extraction

Active Publication Date: 2017-06-30
HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
View PDF1 Cites 7 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Due to the limitations of the Nyquist sampling theorem, the laser trigger method has low sampling frequency and high requirements for instruments and hardware
The sampling method proposed by "Brault" uses an asynchronous counter to record the laser and infrared signals. The asynchronous sampling increases the delay in the two signals, which leads to the need to correct the delay in subsequent processing, and in this method The use of hardware increases the complexity of the instrument structure and reduces the adaptability to the surrounding environment

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Infrared interferogram reconstruction method
  • Infrared interferogram reconstruction method
  • Infrared interferogram reconstruction method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0029] Such as Figure 2-4 , according to the Nyquist sampling theorem, the sampling frequency is at least twice the maximum frequency of the interference signal to be measured, that is

[0030] f s ≥2f m (1)

[0031] The sampling frequency is generally selected to be 5 to 10 times the maximum frequency of the interference signal to be measured. In this embodiment, the sampling rate 10 of 60KS / s is used to oversample the laser interference signal 1 and the infrared interference signal 2 at the same time. The two-way interference signal obtained at this time is a function of time, dt is the time interval of sampling, t i = 0, dt, 2dt, 3dt, ... are the sampling moments corresponding to each laser interference signal sampling point 12 and infrared interference signal sampling point 13, then the infrared interference signal is at the sampling moment of the i sampling point and the laser interference signal at The sampling moment of the i-th sampling point, namely

[0032] t ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses an infrared interferogram reconstruction method, wherein a laser interference signal and an infrared interference signal which are generated through light splitting by a Michelson interferometer exist. The method comprises the steps of simultaneously performing oversampling on the laser interference signal and the infrared interference signal by means of the same sampling rate; according to the requirement in an actual condition, setting the same interpolation factor for performing interpolation operation on two signals after oversampling; acquiring laser zero-crossing information from the laser interference signal after interpolation, and performing resampling on the infrared interference signal after interpolation according to the laser zero-crossing information, and finally obtaining an infrared interferogram with equal light path difference after reconstruction. According to the method of the invention, sampling and interpolation operation on the two signal are performed simultaneously, thereby ensuring time consistency and simplifying extraction to the zero-crossing information of the laser interference signal. The method according to the invention reduces data processing complexity.

Description

technical field [0001] The invention belongs to the field of infrared signal acquisition and processing, and in particular relates to an infrared interferogram reconstruction method. Background technique [0002] In the FTIR spectrometer, the beam splitter in the Michelson interferometer divides the light emitted by the light source into two beams, one of which is reflected by the beam splitter to the fixed mirror of the interferometer, and the other beam is transmitted to the dynamic interferometer by the beam splitter. mirror. Then they are reflected back to the beam splitter along their respective original optical paths and split by the beam splitter, finally generating interference signals. Since the sampling position of the interference signal is very sensitive to the movement speed of the moving mirror in the interferometer, a small change in the movement speed will cause serious deviations in the interferogram, thereby affecting the accuracy of the restored spectrum....

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/45
CPCG01J3/45
Inventor 李胜李妍高闽光李相贤
Owner HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap