Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A self-referencing terahertz electro-optic sampling spectral interferometer and measurement system

An electro-optical sampling and terahertz technology, applied in the field of terahertz measurement, can solve the problem of inability to effectively measure high signal-to-noise ratio and strong terahertz pulses, and achieve the effect of improving the signal-to-noise ratio of a single measurement

Active Publication Date: 2019-01-25
SHENZHEN UNIV
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The present invention provides a self-referencing terahertz electro-optic sampling spectral interferometer, aiming to solve the problem of being unable to effectively measure strong terahertz pulses with high signal-to-noise ratio

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A self-referencing terahertz electro-optic sampling spectral interferometer and measurement system
  • A self-referencing terahertz electro-optic sampling spectral interferometer and measurement system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0023] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0024] As the first embodiment of the present invention, such as figure 1 As shown, the present invention provides a self-reference terahertz electro-optic sampling spectral interferometer, which includes a pulse stretcher 102, a broadband half-wave plate 103, a first lens 106, a terahertz electro-optic crystal 109, and a birefringent crystal 111 , a linear polarizer 112 and a spectrometer 113 . Additionally, if figure 1 As shown, THz pulse represents a terahertz pulse, and Probe pulse represents a detection pulse. The interferometer provided in this embodiment also includes a measuring device SP...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The present invention belongs to the technical field of terahertz measurement and especially relates to a self-reference terahertz electro-optic sampling spectral interferometer and a measurement system. According to the technical scheme of the invention, the self-reference terahertz electro-optic sampling spectral interferometer comprises a pulse stretcher, a wideband half-wave plate, a lens, a terahertz electro-optic crystal, a birefringent crystal, a linear polarizer, and a spectrometer. The structural design of the above optical element ingeniously adopts a self-reference interference structure. On the basis of the electro-optic sampling and spectral interference principle, a chirped pulse is adopted as a probe, so that the single measurement for the high-intensity terahertz pulse time-domain spectroscopy is realized.

Description

technical field [0001] The invention belongs to the technical field of terahertz measurement, in particular to a self-reference terahertz electro-optic sampling spectral interferometer and a measurement system. Background technique [0002] Terahertz waves have unique properties such as high perspective, high security, and high spectral resolution, so they have important academic value and application potential. With the continuous advancement of terahertz optical technology, the intensity of terahertz signal sources has been continuously enhanced, giving birth to terahertz strong field and nonlinear spectroscopy. However, since the terahertz pulse intensity is already strong enough, the traditional terahertz photoconductive sampling and electro-optical sampling techniques are no longer applicable, and traditional techniques cannot effectively measure strong terahertz pulses with high signal-to-noise ratio. Contents of the invention [0003] The invention provides a self-...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01J3/45G01J3/02
CPCG01J3/02G01J3/45
Inventor 徐世祥郑水钦刘俊敏蔡懿曾选科上官煌城
Owner SHENZHEN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com