A capacitance performance detection method of a photoelectric device
A technology of optoelectronic devices and detection methods, which is applied in the fields of instruments, measuring electricity, measuring devices, etc., can solve the problems such as the inability to cyclically change the direction of the test voltage, and the inability to completely reflect the capacitance performance of perovskite solar cell devices.
Inactive Publication Date: 2017-08-04
HUAZHONG UNIV OF SCI & TECH
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[0006] The purpose of the present invention is to provide a method and system for detecting the capacitance performance of photoelectric devices, aiming at solving the problem that the prior art cannot change the test voltage direction cyclically, and only tests the capacitance performance of perovskite solar cells under light conditions, which cannot be completely tested. Technical issues reflecting the capacitive performance of perovskite solar cell devices
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[0024] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.
[0025] figure 1 It is a schematic flowchart of a method for detecting capacitance performance of an optoelectronic device provided by an embodiment of the present invention, including: step S101 to step S102.
[0026] S101, determine the test voltage, the test voltage is used to test the capacitance performance of the optoelectronic device, the test voltage starts from the initial voltage and continuously rises to the end voltage, and then the test voltage starts from the end voltage and continuously decreases To the end of the initial voltage, the rate of rise and fall of the test voltage is the ...
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The invention discloses a capacitance performance detection method of a photoelectric device. The method comprises the steps of determining a test voltage for testing the capacitance performance of the photovoltaic device, wherein the test voltage starts from a starting voltage, continuously rises to a final voltage, and then starts from the final voltage and continuously drops to the stating voltage, and the rate of rising and the rate of decreasing of the test voltage are the same; applying the test voltage to the two ends of the photoelectric device; and determining the capacitance performance of the photoelectric device according to change relations of a test current and the test voltage, wherein the test current is a current flowing through the photoelectric device in a process of continuously changing of the test voltage, and the photoelectric device is placed in an environment without illumination. According to the invention, through testing the continuous changes of the test voltage and changing the rising and decreasing rates of the test voltage, the capacitance performance of the photoelectric device is accurately reflected.
Description
technical field [0001] The invention belongs to the field of detection of capacitance performance of photoelectric devices, and more specifically relates to a method for detection of capacitance performance of photoelectric devices. Background technique [0002] As the third generation of solar cells, perovskite solar cells have attracted more and more attention due to their high photoelectric conversion efficiency, low cost and no pollution. At the same time, a new type of fully printed perovskite solar cell has promoted the industrialization process of perovskite solar cells because of its low cost and high efficiency. Therefore, the technical means to detect the performance of perovskite solar cells are particularly important. [0003] At present, many studies have shown that in the process of testing the photoelectric conversion performance of perovskite solar cells, the current-voltage scanning of perovskite solar cells will cause the forward and reverse curves to not ...
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IPC IPC(8): G01R31/00
CPCG01R31/00
Inventor 荣耀光刘华威韩宏伟胡玥
Owner HUAZHONG UNIV OF SCI & TECH