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Dual-frequency phase-shift three-dimensional measurement method and system

A three-dimensional measurement, frequency-phase technology, applied in measurement devices, instruments, optical devices, etc., can solve the problems of stripe numbering errors and small tolerance of table look-up methods, and achieve the effect of expanding tolerance and solving misjudgment of stripe numbering.

Inactive Publication Date: 2017-08-18
SOUTH CHINA NORMAL UNIVERSITY
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Problems solved by technology

[0004] The purpose of the present invention is to solve the technical problem that the tolerance of the look-up table method in the prior art is small, and it is easy to cause errors when determining the stripe number

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[0026] In order to facilitate the understanding of the present invention, the present invention will be described more fully below with reference to the associated drawings. Preferred embodiments of the invention are shown in the accompanying drawings. However, the present invention can be embodied in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of the present invention more thorough and comprehensive.

[0027] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the technical field of the invention. The terminology used herein in the description of the present invention is only for the purpose of describing specific embodiments, and is not intended to limit the present invention. As used herein, the term "and / or" includes any and all combinations of one or more of th...

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Abstract

The present invention provides a dual-frequency phase-shift three-dimensional measurement method and system. The measurement method includes the following steps that: a computer is utilized to generate two sets of phase shift projection fringes with different frequencies, the fringe period of the phase shift projection fringes satisfies an equation that T1=(A+1 / C1)T2, wherein T1 is a low-frequency stripe period, and T2 is a high-frequency stripe period, if an equation that A=[T1 / T2] is satisfied, it is indicated that the greatest integer of the [T1 / T2] is obtained through floor operation, wherein T2 is the integer multiple of C1, wherein C1 is the multiple of a set range to the low-frequency period T1; the projection fringes are projected onto the surface of a measured object; a wrapping phase is solved through four-step phase-shift solution; and an absolute phase is obtained through a determined mathematical relationship, and unwrapping is realized. With the dual-frequency phase-shift three-dimensional measurement method and system provided by the invention adopted, tolerance can be expanded, and the problem of misjudgment on the serial numbers of fringes can be solved.

Description

technical field [0001] The invention relates to the field of optical three-dimensional measurement, in particular to a dual-frequency phase-shift three-dimensional measurement method and system. Background technique [0002] At present, the optical three-dimensional measuring instrument based on grating projection is mainly composed of projection system, image acquisition system and information processing system: the projection system is composed of white light source, condenser lens group, projection lens, sinusoidal grating template and phase shifter, used to generate sinusoidal grating And project it on the surface of the object; the image acquisition system is mainly composed of a high-resolution CCD camera, a camera platform and a camera lens, which acquires the grating deformation image on the surface of the object and then transmits it to the information processing system; the information processing system is mainly a computer and related algorithms Obtain the wrapped...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/25
CPCG01B11/254
Inventor 刘胜德潘麦铭成陈泽雄陈观文王妍陈玉冰
Owner SOUTH CHINA NORMAL UNIVERSITY
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