Pantograph-overhead-contact-line-system arc plasma multi-parameter acquisition method and apparatus
An arc plasma, multi-parameter technology, applied in the direction of plasma, testing using optical methods, electrical components, etc., can solve problems such as lack of arc, inability to quantitatively analyze internal parameters of pantograph arc, affecting measurement accuracy, etc. simple effect
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[0030] Embodiment 1, the device of the present invention includes an arc spectrum acquisition device, an electrical parameter measurement device, a physical parameter measurement device, and a digital delay generator;
[0031] Wherein, the vehicle-mounted DC power supply supplies power to the arc spectrum acquisition device (1);
[0032] The parameters of the pantograph-catenary arc plasma are measured by the electrical parameter measuring device and the physical parameter measuring device respectively.
[0033] The arc spectrum acquisition device consists of a spectrometer PG2000 (its acquisition range is 350nm-800nm of visible light, the integration time is 10us-100ms, and the acquisition frequency is 10ms), an optical fiber, and a converging lens.
[0034] The electrical parameter measurement device and physical parameter measurement parameters are composed of data acquisition card, Rogowski coil and DC displacement sensor Panasonic HG-C1100 respectively.
[0035] The di...
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