An optoelectronic device frequency response test device and method
An optoelectronic device and frequency response technology, applied in the field of optoelectronics, can solve the problems such as the inability to test and analyze various devices, increase the test complexity and test cost, and poor stability of the heterodyne method, so as to improve the measurement accuracy and flexibility, Conducive to integration and packaging, ensuring stability
Active Publication Date: 2019-06-11
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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Problems solved by technology
[0004] The purpose of the present invention is to test the frequency response of a single device in the existing electro-optical devices, photo-electric devices, and photo-optic devices, and it is impossible to realize the testing and analysis of multiple devices, which increases the number of tests. Complexity and test cost, the problem of low test accuracy, insufficient test resolution of spectroscopy and spontaneous emission method, poor stability of heterodyne method, and additional calibration of frequency sweep method, and provide a frequency response of optoelectronic devices Test device and method, realizing self-calibration test of frequency response of various devices
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[0069] Firstly, a test device for the frequency response of an optoelectronic device is constructed according to the following method:
[0070] Construct a heterodyne instrument composed of an electro-optical device test arm and an optical-optical device test arm, wherein the electro-optical device test arm is composed of a frequency shift module and the electro-optical device to be tested in cascade, and the optical-optical device test arm is composed of The auxiliary modulation module is cascaded with the optical-optical device to be tested;
[0071] Connecting the first signal source to the driving electrode of the electro-optical device to be tested, and connecting the second signal source to the driving electrode of the auxiliary modulation module;
[0072] The frequency f of the optical carrier output by the tunable laser 0 =193.1THz, the frequency shift module on the electro-optic device test arm is an acousto-optic frequency shifter with a frequency shift of 70MHz and...
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The invention provides a test device and method for the frequency response of an optoelectronic device. The present invention is composed of a tunable laser, a heterodyne, an optical-electrical device to be tested, and a spectrum analysis and data processing module in sequence, wherein the heterodyne is an electrical-optical device composed of a frequency-shifting module and an electrical-optical device to be tested The test arm and the auxiliary modulation module are composed of the optical-optical device test arm composed of the optical-optical device to be tested. At the same time, the first signal source is connected to the driving electrode of the electro-optic device to be tested, and the second signal source is connected to the auxiliary modulation module. on the driving electrode; set the frequency relationship between the first signal source and the second signal source to output the sinusoidal microwave signal, and measure the power ratio of the corresponding frequency through the spectrum analysis and data processing module to obtain the electrical-optical device to be tested, the light-to-be-tested device The frequency response value of the optical device and the optical-electrical device to be tested, and each device does not affect each other, and realizes the self-calibration test of the frequency response of multiple devices in a system.
Description
technical field [0001] The invention belongs to the measurement technology in the technical field of optoelectronics, and in particular relates to a testing device and method for frequency response of optoelectronic devices. Background technique [0002] With the rapid increase of communication rate and bandwidth, the microwave-light wave fusion system combining microwave technology and photonic technology has become one of the evolution directions of modern optical fiber communication technology, and electro-optic devices, light-optic devices and light-electric devices are microwave light wave fusion systems. The characteristic parameters of optoelectronic devices, which are indispensable in the system, also affect the performance of the entire microwave-lightwave fusion system, especially the amplitude-frequency response characteristics determine the operating bandwidth of the system. Therefore, the measurement and evaluation of the frequency response of optoelectronic dev...
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IPC IPC(8): G01R23/14
CPCG01R23/14
Inventor 张尚剑王恒邹新海姬在文刘俊伟张雅丽刘永
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA