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Measurement device and measurement method for dielectric material electromagnetic parameter

A technology of electromagnetic parameters and measuring devices, which is applied in the direction of measuring devices, analyzing materials, and using microwave means for material analysis, etc., can solve the problems of wide measuring frequency, fast measuring speed, and high measuring accuracy, and achieve wide measuring frequency and fast measuring speed , the effect of high measurement accuracy

Pending Publication Date: 2017-08-25
XIAMEN UNIV
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Problems solved by technology

[0005] The invention provides a device for measuring electromagnetic parameters of dielectric materials, which aims to solve the problems that the existing technology cannot achieve fast measurement speed, wide measurement frequency band and high measurement accuracy at the same time

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  • Measurement device and measurement method for dielectric material electromagnetic parameter
  • Measurement device and measurement method for dielectric material electromagnetic parameter
  • Measurement device and measurement method for dielectric material electromagnetic parameter

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Embodiment Construction

[0025] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0026] In the device for measuring electromagnetic parameters of dielectric materials provided by the embodiments of the present invention, by setting the special-shaped coaxial measuring fixture as coaxial and enclosing the first cavity, the middle sample cavity and the second cavity of a closed space, A coaxial resonant cavity is formed, and a test box for encapsulating the measurement sample is set in the middle cavity. During the measurement process, the test box is in a closed space, which eliminates the interference of the external electromagnetic field, protects the internal magnetic field, a...

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Abstract

The invention is suitable for the field of dielectric material measurement, and provides a measurement device and a measurement method for a dielectric material electromagnetic parameter. The measurement device for the dielectric material electromagnetic parameter comprises a microwave vector network analyzer, an abnormal-shape coaxial measurement fixture, an input coaxial cable, an output coaxial cable, a GPIB (General Purpose Interface Bus) data acquisition card and a computer, wherein the input coaxial cable and the output coaxial cable are respectively connected with two ends of the abnormal-shape coaxial measurement fixture; the GPIB data acquisition card is connected with the microwave vector network analyzer; the computer is connected with the GPIB data acquisition card. According to the measurement device and the measurement method for the dielectric material electromagnetic parameter in the embodiment of the invention, the abnormal-shape coaxial measurement fixture is arranged, a test box used for packaging a measurement sample is arranged in the abnormal-shape coaxial measurement fixture, the advantages of high measurement accuracy and wide transmission / reflection method measurement frequency band of a resonant cavity method are used, so that the measurement device for the dielectric material electromagnetic parameter has high accuracy and wide measurement frequency band, the microwave vector network analyzer and the computer are arranged to automatically analyze measurement data, and measurement speed is high.

Description

technical field [0001] The invention belongs to the field of dielectric material measurement, in particular to a device and method for measuring electromagnetic parameters of dielectric materials. Background technique [0002] With the wide application of new materials in the communication, computer and national defense industries, manufacturers and users have higher and higher requirements for the measurement accuracy and measurement range of materials, and the complex permittivity and complex permeability are the characteristics of dielectric materials. The important parameters of electromagnetic characteristics, how to meet the requirements of manufacturers and users for the measurement accuracy and measurement range of electromagnetic parameters such as complex permittivity and complex permeability of new materials under the new situation is a new problem faced by microwave testing technology. [0003] In the prior art, electromagnetic parameters such as complex permitti...

Claims

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Application Information

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IPC IPC(8): G01N22/00
CPCG01N22/00
Inventor 刘海张俊明肖芬柳清伙
Owner XIAMEN UNIV
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