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2 results about "Abnormal shapes" patented technology

Lumbar spine abnormal image recognition method and system

The present application relates to lumbar abnormal image recognition method and system, wherein the lumbar abnormal image recognition method comprises the following steps: acquiring the lumbar region MRI image, positioning the left and right apices of the intervertebral disc and the posterior apices of the spinal canal as key points; determining the region of interest in the lumbar image according to the positioned key points, and obtaining the shape image of the lumbar spinal canal through pretreatment; inputting the obtained lumbar spinal canal shape image into the trained classification network model, and judging whether the image contains the abnormal shape of lumbar spinal canal stenosis. By positioning the key points, the region of the lumbar spinal canal is roughly determined, and the most interesting lumbar center region in machine learning is sent into the classification network. Compared with the existing technology of sending the whole MRI image into the classification neural network, the irrelevant information in the network input can be reduced, the features related to the spinal canal stenosis can be more focused on, the abnormal shape image of the lumbar spinal canal stenosis existing in the image data can be accurately recognized, and the recognition accuracy is improved.
Owner:SHANDONG UNIV

A method and device for detecting the breakage of a thimble, a thin film deposition apparatus, and a storage medium

PendingCN122306847AEngineeringAbnormal shapes
This application relates to the field of flaw detection technology, and discloses a method and apparatus for detecting pin fracture, a thin film deposition equipment, and a storage medium. The pin fracture detection method includes: moving an X-ray detection mechanism to the area to be inspected where the pin is located; performing penetration image recognition on the area to be inspected using the X-ray detection mechanism to obtain an image of the pin containing structural features, wherein the structural features include missing or broken parts, abnormal shapes or contours, and abnormal locations and distributions; preprocessing and evaluating the obtained image to be inspected, and generating a pin fault detection result, wherein the fault detection result includes no damage, defects, strain, or fracture.
Owner:JIANGSU MICROVIA NANO EQUIP TECH CO LTD