Arc light source scanning illumination device and method for Fourier stack microscopic imaging

Abstract

The invention discloses an arc light source scanning illumination device and method for Fourier stacking micrography. (2N + 1) sub-light sources of the same model and specification are distributed at the equal interval on the inner surface of the half of the arc to form an arc light source; the center beam emitted by each sub-light source points to the center of the arc of the arc light source, and a sample is set at the center of the arc; the arc light source is fixed on a rotating table, the rotating shaft of the rotating table, the optical axis of a microscopic objective lens and the circular arc diameter of the arc light source are overlapped, the center light beam emitted by one center sub-light source of the arc light source and the optical axis of the microscopic objective lens are overlapped, and other sub-light sources are symmetrically distributed on both sides of the center sub-light source; and the rotating table drives the arc light source to rotate around the optical axis of the microscopic objective lens, a pair of symmetrical sub-light sources are lit to illuminate the sample at each rotation of an angle [Delta][Theta]i, and except the center sub-light source, each sub-light source is rotated by 180 DEG at the equal angular interval [Delta][Theta]I; and when each sub-light illuminates the sample, a camera takes a the microscopic image generated by the objective lens, and a computer reconstructs the image.

Description

technical field [0001] The invention relates to the technical field of optical microscopic imaging, in particular to an arc light source scanning illumination device and method for Fourier stacked microscopic imaging, in particular to Fourier stacked microscopic imaging. Background technique [0002] In 2013, Zheng et al. proposed Fourier lamination technology using flat-panel LED array light source illumination [Zheng G, Horstmeyer R, Yang C, "Wide-field, high-resolution Fourier ptychographic microscopy," Nature photonics, 2013, 7(9): 739-745.], which effectively solved the problem of simultaneous high-resolution and wide-field imaging in microscopy. However, there are some defects in the lighting of the flat-panel LED array light source. Each LED light source in the flat-panel LED array light source emits an approximately conical divergent light beam (such as figure 1 As shown, the radial direction in the figure represents the relative light intensity), the luminous inte...

AI Technical Summary

Problems solved by technology

However, there are some defects in flat panel LED array lighting

Each LED light source in the flat-panel LED array light source emits an approximately conical divergent light beam (such as figure 1 As shown, the radial direction in the figure represents the relative light intensity), the luminous intensity in each angular direction is different, and the central beam ( figure 1 The 0-0° direction beam) has the largest luminous intensity, and the luminous intensity decreases with the increase of the beam angle from the center. Therefore, this flat panel light source has the following problems: (1) The beam intensity of each LED light source illuminating the sample is different; (2) It is difficult to realize large-angle illumination samples; (3) It is difficult to match the fixed light source spacing with different numerical aperture objectives; (4) The fixed light source arrangement makes the illumination method inflexible

Images