Eureka AIR delivers breakthrough ideas for toughest innovation challenges, trusted by R&D personnel around the world.

A multi-temperature zone sapphire microwave source system and control method

A sapphire and microwave source technology, applied in the microwave field, can solve the problem of high output signal and achieve a wide range of economic benefits

Active Publication Date: 2019-03-19
BEIJING INST OF RADIO METROLOGY & MEASUREMENT
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The invention provides a multi-temperature zone sapphire microwave source system and control method, which solves the problem that the current sapphire microwave source with multiple microwave cavities is difficult to ensure that each output signal has a high index

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A multi-temperature zone sapphire microwave source system and control method
  • A multi-temperature zone sapphire microwave source system and control method
  • A multi-temperature zone sapphire microwave source system and control method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0026] In order to make the purpose, technical solution and advantages of the present application clearer, the technical solution of the present application will be clearly and completely described below in conjunction with specific embodiments of the present application and corresponding drawings. Apparently, the described embodiments are only some of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of this application.

[0027] The technical solutions provided by various embodiments of the present application will be described in detail below in conjunction with the accompanying drawings.

[0028] The low-temperature sapphire microwave frequency source has extremely low phase noise (in the X-band, <-160dBc / Hz@10kHz) and excellent short-term stability (<1E-15@1s), and ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The application discloses a multi-temperature-region sapphire microwave source system and a control method thereof, so that a problem of temperature control of a sapphire microwave source can be solved. The system comprises a low-temperature device, microwave chambers, hot plates, a temperature control module and a frequency meter. The microwave chambers and the hot plates are arranged inside the low-temperature device and the rest of components are arranged outside the low-temperature device. A plurality of hot plates are arranged and include plate-like parts, heating wires and thermistors. A plurality of microwave chambers are arranged; and each microwave chamber is at least in contact with one plate-like part fixedly. The temperature control module connected with the thermistors and the heating wires is used for controlling the operating temperatures of the microwave chambers. The frequency meter measures the frequencies of output signals of the microwave chambers. In addition, the control method is as follows: for each microwave chamber, the operating temperature is changed, the frequency is measured, and the difference of the frequency is calculated; a temperature inflection point is searched; and the operating temperatures of the microwave chambers are kept to be at the temperature inflection point. Therefore, each microwave chamber is at the temperature inflection point and a high-index microwave signal is outputted.

Description

technical field [0001] The present application relates to the field of microwave technology, in particular to a sapphire microwave source system and control method. Background technique [0002] Low-temperature sapphire microwave source is a new type of microwave source, which has the advantages of low phase noise and high stability, and is widely used in radar, communication, aerospace, metrology and basic physics research and other fields. At present, low-temperature sapphire microwave sources at home and abroad generally use one sapphire microwave cavity, and some use two microwave cavities, but they share a temperature control area and can only control the two microwave cavities at one temperature point. Using multiple microwave cavities can obtain multiple microwave signal outputs with high stability and low phase noise, but sharing a temperature control zone can only satisfy one microwave cavity in an optimal state, while the other microwave cavities are in a non-optim...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G05D23/24G05D23/30G05B11/42
CPCG05B11/42G05D23/24G05D23/303
Inventor 陈海波朱玺黄凯刘硕高连山
Owner BEIJING INST OF RADIO METROLOGY & MEASUREMENT
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com