Instrument and method for determining polarized raman spectra
A measuring instrument and a Raman spectroscopy technique, which are applied in the measuring instrument and the measuring field of polarization Raman spectroscopy, can solve the problems of complicated operation process, the influence of incident light intensity and signal-to-noise ratio, etc., and achieve the effect of reducing adverse effects
Inactive Publication Date: 2017-09-19
SUZHOU INST OF NANO TECH & NANO BIONICS CHINESE ACEDEMY OF SCI
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The disadvantage of this method is: when changing the geometric configuration, it is necessary to frequently change the optical components in the optical path, and the operation process is more complicated; in addition, adding optical components will affect the intensity of incident light and the signal-to-noise ratio
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[0022] Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings. This invention may, however, be embodied in many different forms and should not be construed as limited to the specific embodiments set forth herein. Rather, the embodiments are provided to explain the principles of the invention and its practical application, thereby enabling others skilled in the art to understand the invention for various embodiments and with various modifications as are suited to particular intended uses. In the drawings, the shapes and dimensions of elements may be exaggerated for clarity, and the same reference numerals will be used throughout to designate the same or like elements.
[0023] It will be understood that, although the terms "first", "second", etc. may be used herein to describe various elements, these elements should not be limited by these terms. These terms are only used to distinguish one element from another...
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The invention disclsoes a method for determining polarized raman spectra. The method is used for determining the polarized raman spectra of a hexagonal crystal, and comprises the steps of sequentially rotating the hexagonal crystal to a first sampling point, ..., and an n+1 sampling point along a predetermined direction, wherein the rotation angles of the hexagonal crystal when rotating to the first sampling point, ..., and the n+1 sampling point from an initial position are respectively marked as gamma 1, ..., gamma n+1; rotating until the rotation angle gamma n+1 is not less than 180 degrees; respectively collecting polarized raman spectra of the hexagonal crystal at the first sampling point to the n+1 sampling point, drawing polarized raman spectrograms, extracting polarized scattering intensity in each polarized raman spectrogram, and drawing a trend chart of polarized scattering intensity-rotation angles. The invention discloses an instrument for determining the polarized raman spectra. According to the method and the instrument for determining provided by the invention, less optical components are used, the optical components in an optical path have no need to be frequently changed, and the polarized raman spectra with high intensity and good signal-to-noise ratio can be simply and conveniently obtained.
Description
technical field [0001] The invention belongs to the technical field of chemical spectrum analysis and testing, and in particular relates to a measuring instrument for polarized Raman spectrum and a measuring method thereof. Background technique [0002] Because of its non-contact and non-damaging characteristics, Raman spectroscopy has a very wide range of applications in the study of the composition, structure, stress, crystallinity, etc. of substances. The theoretical analysis of molecular vibrational spectroscopy shows that the probability of molecular vibrational modes appearing in the Raman spectrum is strictly limited by the selection rule. The Raman activity condition limited by the Raman selection rule is: the first derivative of the polarizability at the equilibrium position is not zero. The derivative value is determined by the symmetry of the crystal. For anisotropic crystals such as hexagonal GaN, Raman spectroscopy tests with different geometric configurations...
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IPC IPC(8): G01N21/65G01J3/44
CPCG01N21/65G01J3/44
Inventor 胡匀匀周桃飞郑树楠王建峰徐科
Owner SUZHOU INST OF NANO TECH & NANO BIONICS CHINESE ACEDEMY OF SCI