191 results about "Hexagonal crystals" patented technology

The invention relates to the technical field of magnesium alloys, and particularly discloses a multi-element microalloying high-strength corrosion-resistant magnesium alloy bar and a preparation method thereof. The multi-element microalloying high-strength corrosion-resistant magnesium alloy bar comprises the following chemical components in percentage by mass: 6-7% of Al, 0.1-0.15% of La, 0.1-0.15% of Ca, 0.1-0.15% of Y and the balance of Mg and inevitable impurities, the magnesium alloy bar is of a multi-phase structure, a magnesium matrix is of a close-packed hexagonal crystal structure, and the multi-element microalloying high-strength corrosion-resistant magnesium alloy bar is obtained through extrusion and bar rotary swaging deformation process treatment. The multi-element microalloyed high-strength corrosion-resistant magnesium alloy bar prepared by the invention has the advantages of high strength and corrosion resistance.

The invention belongs to the technical field of photocatalysis, and particularly discloses a diatomic metal complex / CdS nanorod composite photocatalyst as well as a preparation method and application thereof. The specific preparation method comprises the following steps: synthesizing a pure CdS nanorod by using an EDA assisted solvothermal reaction; then carrying out Schiff base reaction, heating in an oil bath, and condensing and refluxing to synthesize a diatomic metal complex; and putting the diatomic metal complex and the CdS nanorod into a beaker, adding ethanol, uniformly stirring and drying to obtain the diatomic metal complex and CdS nanorod photocatalytic composite material, namely the target product. The CdS nanorod is of a rod-shaped hexagonal crystal structure, the diatomic metal complex is blocky and is loaded on the wall of the CdS nanorod after being compounded with the CdS nanorod, and the main morphology of the CdS nanorod is not changed. According to the invention, the diatomic metal complex is compounded with the CdS nanorod, so that photo-induced electrons and holes can be effectively separated, and the activity of photocatalytic formic acid decomposition to prepare synthesis gas (H2 + CO) is improved.

To provide a coated cutting tool which is excellent in durability for an AlCrSi nitride having a large Si content and a microstructure, even if a content ratio of nitrogen is high.SOLUTION: A coated cutting tool has a hard film on a base material. The hard film is composed of a nitride or a carbonitride having 50 atom% or more and 70 atom% or less Al, 20 atom% or more and 50 atom% or less Cr, and 4 atom% or more and 15 atom% or less Si, with respect to a total amount of metal containing semimetal. As for the hard film, an atomic ratio (atom%) A of the metal element containing the semimetal and an atomic ratio (atom%) B of nitrogen satisfy a relation of 1.07<B / A<1.30. As for the hard film, in an intensity profile determined from an X-ray diffraction pattern or a limited field diffraction pattern of a transmission electron microscope, peak intensity caused by a (200) plane or a (111) plane of a cubic crystal indicates maximum intensity, and in the intensity profile determined from the limited field diffraction pattern, there is no peak mainly containing a hexagonal crystal.SELECTED DRAWING: None

The present invention relates to: a substrate having an upper surface oriented to a (111) crystal plane; and a graphene laminated structure including same. Particularly, disclosed is a substrate having an upper surface oriented to a (111) crystal plane, the substrate comprising: a metal foil substrate; a metal oxide thin film formed by deposition of a cubic metal oxide on the substrate, and crystal-oriented so that the orientation of the (001) crystal plane of the metal oxide is parallel to the perpendicular direction to the surface of the substrate; a (001) crystal plane-oriented first thin film formed on the metal oxide thin film by deposition of a first metal having a hexagonal crystal structure, and crystal-oriented so that the orientation of the (001) crystal plane of the first metal is parallel to the perpendicular direction to the surface of the substrate; and a (111) crystal plane-oriented second thin film formed on the first thin film by deposition of a cubic metal oxide, and crystal-oriented so that the orientation of the (111) crystal plane of the second metal is parallel to the perpendicular direction to the surface of the substrate.

To provide a magnesium silicon nitride film having piezoelectric characteristics, a piezoelectric body, and a piezoelectric element.SOLUTION: A magnesium silicon nitride film contains magnesium, silicon, and nitrogen, and a crystalline phase contains hexagonal crystal. A piezoelectric body and a piezoelectric element include the magnesium silicon nitride film. The magnesium silicon nitride film may contain aluminum. The hexagonal crystal contained in the magnesium silicon nitride film may have a wurtzite type structure. A thickness of the magnesium silicon nitride film may be 2,000 nm or lower.SELECTED DRAWING: Figure 1

This solid electrolyte has: a first crystallite which is formed into a primary particle and has a first crystal structure; a second crystallite which is formed into the same primary particle as the first crystallite and has a second crystal structure that is different from the first crystal structure; and an amorphous phase. The first crystallite and the second crystallite each contain lithium, the first crystal structure is a hexagonal crystal structure, the second crystal structure is an orthorhombic crystal structure, and the crystallite size of the first crystallite and the crystallite size of the second crystallite are both 50 nm or less.

A bilayer film of a magnetic body and an insulator has an antiferromagnetic layer having a hexagonal crystal structure and at least one surface of which is the (10-10) surface of an antiferromagnetic body, and an insulator layer containing two or three or four atoms laminated on the (10-10) surface of the antiferromagnetic layer. A bilayer film of a magnetic body and an insulator has an antiferromagnetic layer having a hexagonal crystal structure and at least one surface of which is the (0001) surface of an antiferromagnetic body, and an insulator layer containing two or three or four atoms laminated on the (0001) surface of the antiferromagnetic layer. The tunneling magnetoresistive element has a second antiferromagnetic film layer laminated on the insulator of the bilayer film. The magnetic memory includes a plurality of the tunneling magnetoresistive elements.

The invention discloses ceramic slurry for a lithium ion battery, a ceramic diaphragm and the lithium ion battery. The ceramic slurry comprises the following components in parts by mass: 12-58.8 parts of cordierite ceramic powder, 0.1-10 parts of an adhesive, 0.1-5 parts of a dispersing agent, 0.01-2 parts of a thickening agent and 40-80 parts of water. The ceramic diaphragm comprises ceramic slurry. According to the invention, cordierite ceramic powder is used as a main raw material and has a layered crystal structure and a hexagonal crystal structure, the crystal of the cordierite ceramic powder contains tetrahedral and octahedral units of magnesium, aluminum and silicon, a complex three-dimensional network is formed, ions, especially lithium ions and sodium ions, can freely move in crystal lattices of the cordierite ceramic powder, the migration energy barrier is low, and the performance of the cordierite ceramic powder is improved. The cordierite ceramic powder disclosed by the invention has relatively high ionic conductivity and lower relative density, and the energy density of a high-rate battery is obviously improved when the cordierite ceramic powder is used for the high-rate battery.

The invention belongs to the technical field of preparation means of functional materials, and particularly relates to a CrSb single crystal film and a preparation method for preparing a staggered magnetic CrSb single crystal film through molecular beam epitaxy. The CrSb single crystal thin film sequentially comprises a substrate SiC / a buffer layer CrTe2 / CrSb single crystal thin film from bottom to top, and when the crystal orientation of the CrSb single crystal thin film is (0001), the CrSb single crystal thin film has six-degree symmetry. A Cr source and an Sb source are placed in different evaporation sources respectively, and evaporated Cr and Sb atoms are deposited on the surface of the SiC (111) substrate subjected to surface treatment in an ultrahigh vacuum environment. The deposition rate of Cr atoms is # imgabs0 # / min; the deposition rate ratio of Cr to Sb atoms is 1: 12; and the surface temperature of the SiC (111) substrate is 370 DEG C to 400 DEG C. According to the method, the staggered magnetic CrSb single crystal film is controllably synthesized by controlling the deposition rate of raw materials and the surface temperature of a substrate on the basis of cooperative control among the processes; the staggered magnetic CrSb single crystal film with the hexagonal crystal structure prepared by the method has an atomic-scale flat surface and excellent crystal orderliness, can meet the performance requirements of spintronics device preparation, and is suitable for subsequent scientific research.

A cutting tool, including: a base; and a coating disposed on the base, wherein the coating includes a first layer, the first layer is composed of an alternate layer in which a first unit layer and a second unit layer are alternately stacked, the first unit layer has a hexagonal crystal structure, the first unit layer is composed of W(C1-aNa)x, a represents 0.3 or more and 0.8 or less, x represents 0.8 or more and 1.2 or less, the second unit layer is composed of AlcV1-cN, and c represents 0.40 or more and 0.80 or less.

This antiferromagnetic material has a hexagonal crystal structure (space group P63 / mmc) and has a composition of (Mn1-xAx)3Sn (0<x<0.15, A=Ti, V, Cr, Zr, Nb, Mo, Tc, Hf, Ta, W, Re) or Mn3Sn1-yBy (0<y<0.35, B=Sc, Ti, V, Ga, Y, Zr, Nb, In, Hf, Tl). A is preferably at least one of V and Cr. Also, B is preferably at least one of Ga, In, and Tl.

The present invention pertains to lithium-nickel-manganese composite oxide particles are for use in a positive electrode active material for a lithium-ion secondary battery, and the lithium-nickel-manganese composite oxide particles include secondary particles formed by the aggregation of primary particles containing a lithium-nickel-manganese composite oxide having a hexagonal crystal structure with a layered structure. The secondary particles each have a hollow structure including an outer shell portion and a hollow portion formed inside the outer shell portion. The lithium-nickel-manganese composite oxide particles include, as 20% or more of the total number of the secondary particles, through‑hole-containing secondary particles that each have a through‑hole which has an average diameter of 20 nm or more and penetrates the outer shell portion from the outside of the outer shell portion to the hollow portion.

1. Name of the product in this design: Inductive switch (hexagonal crystal). 2. Application of this design: This design is used for intelligent switches. 3. The key design feature of this product is its shape. 4. The image or photograph that best illustrates the design's key points: a 3D model.

The application relates to a novel lithium ion battery layered sulfide positive electrode material, which has a general formula of Li 1.33‑0.33x V x Ti 0.67‑0.67x S2, and 0<=x<=0.5. The positive electrode material belongs to a hexagonal crystal structure of O3 type, and a corresponding space group is P63 / mmc. The micro-morphology of the positive electrode material is granular, the particle size is about 20-50 mu m, and each element is uniformly distributed on the particle surface and inside. In the positive electrode material, almost all the capacity comes from the redox reaction of sulfur, and the capacity contribution of vanadium can be ignored. Electrochemical test and solid-state nuclear magnetic characterization results show that the Li 1.27 V 0.2 Ti 0.53 S2 positive electrode material has a reversible capacity of up to 308 mAh g ‑1 , and realizes reversible deintercalation of all Li + in the system. Meanwhile, the material exhibits extremely excellent rate and cycle performance, has a capacity retention rate of 81.0% after 4300 cycles of long cycle, and has almost no voltage attenuation in the cycle process.

An SiC semiconductor device includes an SiC semiconductor layer including an SiC monocrystal that is constituted of a hexagonal crystal and having a first main surface as a device surface facing a c-plane of the SiC monocrystal and has an off angle inclined with respect to the c-plane, a second main surface at a side opposite to the first main surface, and a side surface facing an a-plane of the SiC monocrystal and has an angle less than the off angle with respect to a normal to the first main surface when the normal is 0°.

The invention relates to the technical field of lanthanum oxycarbonate, and discloses a lanthanum oxycarbonate catalyst and a preparation method and application thereof, and the lanthanum oxycarbonate catalyst comprises hexagonal crystal phase lanthanum oxycarbonate and hexagonal crystal phase lanthanum oxycarbonate containing a doping element R. The method comprises the following steps: (1) adding alkali liquor into a solution of a lanthanum source, and then carrying out solid-liquid separation and drying to obtain lanthanum hydroxide; (2) contacting a solution of a compound containing a doping element R with lanthanum hydroxide, and then drying; and (3) roasting the dried product in the step (2) in a carbon-containing atmosphere to obtain the lanthanum oxycarbonate catalyst. When the catalyst prepared by the method is used for the oxidative coupling reaction of methane, the yield of C2 hydrocarbon is relatively high.

The objective is to provide a heat-shielding composition that includes a dispersion powder that can be converted into an aqueous dispersion using water as a dispersion medium by adding water. [Solution] A nonionic polymer dispersant and A crystal with a hexagonal crystal structure, general formula M x WO y (However, element M includes one or more elements selected from Li, Na, K, Rb, Cs, Fr, Be, Mg, Ca, Sr, Ba, Ra, and satisfies 0.1 ≤ x ≤ 1.0 and 2.0 ≤ y < 4.0) Composite tungsten oxide particles containing composite tungsten oxide, A heat-shielding composition comprising polycarbonate resin or acrylic resin.

The invention discloses a method for preparing complex silicon-carbon-containing solid waste into multi-type silicon carbide or multi-structure graphene based on instantaneous carbon thermal shock selective regulation and control. The method comprises the following steps: putting the complex silicon-carbon-containing solid waste into a graphite reactor; current is applied to the graphite reactor through Joule heating for flash evaporation treatment, the temperature range of the flash evaporation treatment is 1500-2800 DEG C, and the heating rate is larger than 400 DEG C / s; by cooperatively controlling the intensity of the applied current, the flash evaporation temperature and the flash evaporation time, the complex silicon-carbon-containing solid waste is converted into a target product; the target product comprises at least one of cubic crystal form 3C-SiC, hexagonal crystal form 6H-SiC, turbine layered graphene and hybrid AB-turbine layered graphene. According to the method, the non-equilibrium dynamic principle is utilized, the problems that a traditional recycling method is difficult to cooperatively treat complex solid waste, low in product value and single in type are effectively solved, high-selectivity and high-valued conversion of the waste is achieved, the technological process is simple, energy is saved, environment friendliness is achieved, and a new way is provided for solid waste recycling.

A negative electrode material for a lithium-ion secondary battery comprises graphite particles, wherein the R value of the graphite particles measured by Raman spectroscopy is less than 0.27, and the intensity ratio (P1 / P2) of the diffraction peak (P1) of the hexagonal structure (101) plane to the diffraction peak (P2) of the rhombohedral structure (101) plane in an X-ray diffraction pattern obtained using CuKα rays is less than or equal to 5.0.

The solid electrolyte has: first crystallites formed on primary particles and having a first crystal structure; a second crystallite formed in the same primary particle as the first crystallite and having a second crystal structure different from the first crystal structure; and an amorphous phase, the first crystallites and the second crystallites each contain lithium, the first crystal structure is a hexagonal crystal, the second crystal structure is an orthorhombic crystal, and both the crystallite size of the first crystallites and the crystallite size of the second crystallites are 50 nm or less.

A semiconductor device includes a semiconductor die including a substrate having a hexagonal crystal structure. The first and second sides of the semiconductor die extend along respective first and second crystal axes of the hexagonal crystal structure of the substrate.

Electromagnetic wave absorbing particles including cesium tungsten oxide represented by a general formula CsxW1-yO3-z (0.2≤x≤0.4, 0<y≤0.4, and 0<z≤0.46) and having an orthorhombic crystal structure or a hexagonal crystal structure are provided.

A coated cutting tool is provided with a hard coating film on a base material. The hard coating film is composed of a nitride or carbonitride containing 50 at% to 70 at% (inclusive) of Al, 20 at% to 50 at% (inclusive) of Cr, and 4 at% to 15 at% (inclusive) of Si with respect to the total amount of metal including semimetal. The atomic ratio (at%) A of a metal element including a semimetal and the atomic ratio (at%) B of nitrogen in the hard coating satisfy 1.07 lt; b / Alt; 1.30, 1.30. The hard coating film exhibits a maximum peak intensity caused by a (200) plane or a (111) plane of a cubic crystal in an intensity distribution determined from an X-ray diffraction pattern or a selected area diffraction pattern of a transmission electron microscope, and does not have a peak mainly composed of a hexagonal crystal in the intensity distribution determined from the selected area diffraction pattern.

This invention belongs to the field of magnetic refrigeration technology, specifically relating to the application of a hexagonal crystal material Sr6GdSc(BO3)6 in ultra-low temperature magnetic refrigeration. This hexagonal crystal material Sr6GdSc(BO3)6 does not undergo a phase transition at temperatures above 100 mK and exhibits a large magnetocaloric effect near 1 K. The maximum magnetic entropy changes under magnetic field variations of 0–1 T, 0–2 T, and 0–3 T are 39.36 mJ·cm⁻¹, respectively. ‑3 · K ‑1 Or 9.01 J·kg ‑1 ·K ‑1 53.95 mJ·cm ‑3 ·K ‑1 Or 12.34 J·kg ‑1 ·K ‑1 and 59.49 mJ·cm ‑3 ·K ‑1 Or 13.61 J·kg ‑1 ·K ‑1 The hexagonal crystal material Sr6GdSc(BO3)6 of this invention exhibits significant magnetocaloric effects and superior low-temperature performance, and has great application prospects in the field of ultra-low temperature magnetic refrigeration technology.

The invention relates to an easy-to-activate AB5 type multi-element doped modified hydrogen storage material and a preparation method and application thereof, the chemical general formula of the hydrogen storage material is LaxCeyNdzNiaFebMnc, x + y + z = 1, x is greater than or equal to 0.5, y is greater than or equal to 0 and less than or equal to 0.5, and z is greater than or equal to 0 and less than or equal to 0.5; a + b + c = 5, a > = 4, 0 < = b < = 1, 0 < = c < = 1, and at least two of y, z, b and c are not equal to 0. Compared with the prior art, the single-phase AB5 type hydrogen storage alloy with a hexagonal crystal form is prepared by synergistically replacing A site (La) by Ce / Nd and replacing B site (Ni) by Fe / Mn according to a specific proportion, the alloy has relatively high hydrogen storage capacity and rapid hydrogen absorption and desorption dynamic performance, the hysteresis of a hydrogen absorption and desorption platform is obviously improved, and rapid hydrogen absorption and the like can be completed without hydrogen absorption and desorption activation.

A coated tool according to the present disclosure comprises a base body and a coating layer arranged on the base body and formed from cubic crystals. An X-ray diffraction spectrum measured for the coating layer after it was held for 0.5 hours at a temperature of 1200°C in a non-oxidizing atmosphere satisfies the relationship Ih(100) / Ih(002) ≤ 0.9. Ih(100) is the intensity of a diffraction peak corresponding to a (100) plane of a hexagonal crystal formed in the coating layer. Ih(002) is the intensity of a diffraction peak corresponding to a (002) plane of the hexagonal crystal.

Heterojunction structure for a high electron mobility transistor, comprising successively: - a substrate (1); - a nucleation layer (2), made of a material chosen from monocrystalline silicon Si having a crystal orientation of the "111" type and monocrystalline aluminum nitride AlN having a hexagonal crystal structure of the "2H" type; - a buffer layer (3) devoid of carbon atoms, made of a material chosen from aluminum nitride AlN and aluminum-gallium nitride AlxGa1-xN with x>0.5; - first and second semiconductor layers (4, 5), made respectively from first and second III-N type alloys chosen so that the first and second semiconductor layers (4, 5) have a heterojunction (H) adapted to form a two-dimensional electron gas. Figure 5

The invention relates to a group III-V semiconductor material, which has a metastable hexagonal crystal structure, in the form of a thin film up to 1µm thick. Figure 1.

The present invention discloses a method, device and storage medium for determining the irradiation cascade range of a close-packed hexagonal crystal, which relates to the technical field of cascade range calibration, and is mainly capable of improving the efficiency and accuracy of determining the irradiation cascade range of a close-packed hexagonal crystal. In response to a determination signal of the irradiation cascade range of a close-packed hexagonal crystal to be detected, the irradiation process of the close-packed hexagonal crystal to be detected is simulated, and during the simulation process, off-site cascade process data of cascade collisions of atoms in the close-packed hexagonal crystal to be detected when irradiated by incident particles is obtained; based on the off-site cascade process data, an off-site cascade process diagram of the close-packed hexagonal crystal to be detected is determined; a preset calibration algorithm is used to perform a rough calibration of the off-site cascade process diagram to obtain an initial cascade range; the atomic energy difference between each atom within the initial cascade range is determined, and based on the atomic energy difference, the cascade range of the close-packed hexagonal crystal to be detected is determined within the initial cascade range.

The invention relates to a semiconductor nitride film material and a preparation method thereof, and belongs to the technical field of semiconductor film materials. The semiconductor nitride thin film material comprises the following components: a compound with a chemical formula of Al < 1-x > Si < x > N < 1-y > O < y >, the compound is a hexagonal system, and the crystal space group is P63mc. The preparation method of the semiconductor nitride thin film material comprises the following steps: cleaning a substrate; according to the method, Al or Al and Si are used as a target material, the target material is sputtered in a high-power pulse magnetron sputtering mode in an argon and nitrogen mixed gas environment, and the semiconductor nitride thin film material is deposited on a substrate. The semiconductor nitride film material has excellent insulativity, thermal stability, wear resistance and hydrophobicity at the same time, and can meet application requirements in various complex environments.