Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

4F system-based novel angle modulation SPR (Surface Plasmon Resonance) imaging system

A technology of angle modulation and imaging system, which is applied in the direction of instruments, measuring devices, scientific instruments, etc., and can solve problems such as low sensitivity, poor stability, and slow detection speed

Inactive Publication Date: 2017-09-29
SHENZHEN UNIV
View PDF8 Cites 7 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The main purpose of the present invention is to provide a novel angle modulation SPR imaging system based on the 4F system, aiming to solve the technical problems of slow detection speed, low sensitivity and poor stability in the prior art

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • 4F system-based novel angle modulation SPR (Surface Plasmon Resonance) imaging system
  • 4F system-based novel angle modulation SPR (Surface Plasmon Resonance) imaging system
  • 4F system-based novel angle modulation SPR (Surface Plasmon Resonance) imaging system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0028] In order to make the purpose, features and advantages of the present invention more obvious and understandable, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described The embodiments are only some of the embodiments of the present invention, but not all of them. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without making creative efforts belong to the protection scope of the present invention.

[0029] Because the angle modulation SPR in the prior art has technical problems such as slow detection speed, low sensitivity and poor stability.

[0030] In order to solve the above technical problems, the present invention proposes a novel angle-modulated SPR imaging system based on the 4F system. In the system, the first 4F system and the ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a 4F system-based novel angle modulation SPR (Surface Plasmon Resonance) imaging system. According to the 4F system-based novel angle modulation SPR imaging system disclosed by the invention, when angle scanning is carried out by a scanning galvanometer, P polarized light emitted to a first 4F system can be kept in parallel incidence and emergence, and the position of a spot formed by irradiating incident light to a sensing film is always kept unchanged no matter how the angle of the incident light changes; a second 4F system is added in a reflection light path, an imaging position of a receiver is enabled not to move at different angles, the stability is good, and the imaging quality is high, so that an SPR excitation and detection zone during a scanning process is always enabled to be the same and unchanged, a sensing zone on the sensing film can be increased, a sensing surface is enabled to have good sensing consistency, quick detection can be effectively realized, and the requirement on high-sensitivity detection during a quick detection process can be met; further, the 4F system-based novel angle modulation SPR imaging system also has the advantages of simple structure, small size and the like.

Description

technical field [0001] The invention relates to the field of image imaging technology, in particular to a novel angle modulation SPR imaging system based on a 4F system. Background technique [0002] Surface Plasmon Resonance (SPR) has been used in many biochemical fields such as biological detection, drug analysis, molecular recognition, etc. due to its high sensitivity, high throughput, label-free, rapid detection and many other advantages. Rapid development has become an important monitoring tool. [0003] The Kretschmann prism structure is currently the most commonly used coupling structure for SPR sensors. Based on this structure, there are mainly four detection modes, namely intensity modulation, angle modulation, wavelength modulation and phase modulation. Among them, the intensity-modulated SPR technology needs to work at a fixed excitation wavelength and incident angle. For the application of simultaneous detection of multiple molecules (high-throughput detection),...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/552G01N21/01
CPCG01N21/553G01N21/01
Inventor 邵永红曾佑君蔡志文
Owner SHENZHEN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com