Anti-explosion high-low-temperature low-air-pressure testing system

Abstract

The invention relates to the technical field of testing tanks and particularly relates to an anti-explosion high-low-temperature low-air-pressure testing system. The testing system is characterized by further comprising a rapid reduced pressure testing device, wherein the rapid reduced pressure testing device is used for used for realizing extremely low air pressure, rapid pressure reduction and explosion reduced pressure test under a non-control condition of a temperature and humidity environment and comprises a testing tank body, a vacuum rapid-open butterfly valve, a pressure-storage auxiliary tank body, a liquid nitrogen tank and a first measurement control system; a testing tank is a temperature-humidity low-air-pressure testing tank, can meet the testing requirements of temperature low air pressure, low air pressure and temperature and humidity low air pressure under a controlled condition of the temperature and humidity environment and comprises the testing tank body, a heating-refrigerating system, an air adjusting system, a humidifying system, a dehumidifying system, a vacuum system, a pressurization system, a second measurement control system and an anti-explosion pressure relief device. Compared with the prior art, the anti-explosion high-low-temperature low-air-pressure testing system can be used for simulating a single testing environment and complex testing environments, has an anti-explosion function and is convenient to operate.

Description

technical field [0001] The invention relates to the technical field of test chambers, in particular to an explosion-proof high-low temperature low-pressure test system. Background technique [0002] Existing high and low temperature and low pressure test systems generally only design some simple simulated environments of temperature, humidity and air pressure, see patent number: 2010800691372, patent name: low pressure, high and low temperature test chamber capable of humidity control; application number 2015109622495 , the name is: a high and low temperature test chamber with PID control. There is a lack of test equipment for the dangerous ultra-high pressure environment and how to quickly decompress the ultra-high pressure environment. Contents of the invention [0003] The purpose of the present invention is to overcome the deficiencies in the prior art, combine the high-low temperature low-pressure test chamber and the rapid decompression test device together, and the...

AI Technical Summary

Problems solved by technology

There is a lack of test equipment for the dangerous ultra-high pressure environment and how to quickly decompress the ultra-high pressure environment