Method for automatically processing GPIB communication abnormality

Abstract

The invention discloses a method for automatically processing GPIB communication abnormality. The method for automatically processing GPIB communication abnormality is composed of two parts: a GPIB communication feedback structure and GPIB communication processing software; the GPIB communication feedback structure is a printed circuit board, wherein the printed circuit board comprises a signal on-off display LED, an LED control trace, a GPIB slot, a GPIB signal trace, a USB slot and a USB signal trace; the GPIB communication processing software needs to install on an ATE computer. By using the method for automatically processing GPIB communication abnormality provided by the invention, the GPIB communication abnormality can be automatically processed, the feedback and processing time of the GPIB communication abnormality is greatly reduced, the testing efficiency is improved, and the testing cost is reduced.

Description

technical field [0001] The invention relates to a method for automatically processing GPIB communication abnormalities, in particular to a method for automatically processing GPIB communication abnormalities applied in integrated circuit testing. Background technique [0002] In integrated circuit wafer testing, it is necessary to connect Probe to ATE for communication using GPIB to complete automatic testing. In addition, some wafers and finished circuit tests are limited by the technical specifications of ATE, and additional instruments and meters are required to cooperate with ATE for testing. At this time, it is also necessary to use GPIB to connect ATE and instruments to complete automatic testing. [0003] The technical invention provides a method for automatically handling GPIB communication abnormalities, which can be applied to the above-mentioned integrated circuit test. This method has the advantages of wide application range, simple use and fast response, which ...

AI Technical Summary

Problems solved by technology

The time for abnormal feedback may be long or short, and exception handling requires the knowledge accumulation of test engineers. Some test engineers do not have enough knowledge accumulation and take a long time to process, or even fail to process, resulting in a greatly increased test time cost

Therefore, this type of technology requires fast abnormal feedback, which requires the support of the test team. At the same time, test engineers need to accumulate GPIB communication knowledge, which is a threshold that limits the rapid development of integrated circuit testing.

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