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Fault detection rate allocation method

A technology of fault detection rate and allocation method, which is applied in the direction of instruments, etc., can solve the problems of affecting testability design results, large difference in allocation results, two skins, etc., and achieve the effect of easy understanding, reasonable allocation results, and simple algorithms

Active Publication Date: 2017-11-03
XIAN AIRCRAFT DESIGN INST OF AVIATION IND OF CHINA
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Problems solved by technology

Different designers have different understandings of the allocation method and the design itself, which often make their respective allocation results differ greatly, resulting in a mismatch between the test allocation results and the test design work, forming "two skins". "Phenomenon, which directly affects the results of testable design

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Embodiment Construction

[0019] In order to make the objectives, technical solutions and advantages of the present invention clearer, the technical solutions in the embodiments of the present invention will be described in more detail below in conjunction with the drawings in the embodiments of the present invention. In the drawings, the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The described embodiments are some, but not all, embodiments of the invention. The embodiments described below by referring to the figures are exemplary and are intended to explain the present invention and should not be construed as limiting the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention. Embodiments of the present invention will be described in detail below ...

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Abstract

The invention discloses a fault detection rate allocation method and belongs to the field of test performance design. The method comprises the following steps of firstly, constructing a diagnosis framework of a to-be-allocated system, and determining to-be- allocated units; secondly, acquiring the fault rate and the maintenance time of any to-be-allocated unit, and determining the weighting factor of each to-be-allocated unit according to the fault rate and the maintenance time; finally, according to the weighting factor and the fault detection rate of the to-be-allocated system, conducting the testability allocation. According to the invention, the weighting factor allocation method is adopted for allocating the fault detection rate. According to the weighting factor allocation method, factors considered for allocation are converted into weighting factors, and then the allocation is conducted according to the weighting factors. As a result, the accuracy and the precision of an allocation result are improved. The design personnel of the system and equipment can be better guided and restrained to conduct the design for testability correspondingly.

Description

technical field [0001] The invention belongs to the field of testable design, and in particular relates to a fault detection rate distribution method. Background technique [0002] The mathematical model of testability distribution is a mathematical equation that indicates testability parameters, and indicates the mathematical relationship between the part and the whole of the system, that is, the functional relationship between the testability index of the system and the index of its constituent units. The basic requirement (objective function) of the testing assignment is: under the constraint conditions such as usage requirements and system characteristics, the indicators of each component are obtained from the system requirements indicators, and the system indicators obtained by combining the indicators allocated by each component unit are equal to Or greater than the originally required index, and then build a mathematical model of fault detection rate allocation. The t...

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Application Information

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IPC IPC(8): G06Q10/00
CPCG06Q10/20
Inventor 谢娜
Owner XIAN AIRCRAFT DESIGN INST OF AVIATION IND OF CHINA
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