Analog signal detection system and analog signal detection method
An analog signal and detection system technology, applied in the field of signal detection, can solve the problems of shortening the detection time of the analog signal, reducing the complexity of the analog signal detection system, etc., to achieve the effect of reducing the complexity, ensuring the test accuracy, and having a simple circuit structure
Active Publication Date: 2019-11-01
SEMICON MFG INT (SHANGHAI) CORP +1
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Problems solved by technology
[0005] The technical problem solved by the invention is to shorten the detection time of the analog signal and reduce the complexity of the analog signal detection system at the same time
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Embodiment Construction
[0031] As mentioned in the background section, the analog signal detection system in the prior art has the problems of long test time and high cost of test resources.
[0032] The inventor of the present application analyzed the analog signal detection system in the prior art.
[0033] The patent document EP19950306854 discloses an analog signal detection system, which uses a MUX to switch the measured analog signal and takes the output signal as the measured signal, and uses the first voltage comparator and the second voltage comparator to control the upper signal of the measured signal. The limit value and the lower limit value are compared and measured; wherein, the two input terminals of the first voltage comparator are input with the first reference voltage and the measured signal, and the two input terminals of the second voltage comparator The second reference voltage and the measured signal are input, and the comparison results output by the two voltage comparators are...
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The invention discloses a simulation signal detection system and a simulation signal detection method. The simulation signal detection system is applicable to detecting an amplitude of a multi-path input simulation signal. The simulation signal detection system comprises a multi-path signal selection circuit, a comparison circuit, a logic operation unit, a detected signal selection circuit, and a reference voltage switching circuit. The comparison circuit is used for comparing two paths of simulation signals and outputting a first comparison result; the logic operation unit is used for generating a first address signal and a second address signal, performing sequencing on at least two paths of input simulation signals according to a first comparison result; the detected signal selection circuit is used for choosing a detected signal from the multi-path input simulation signals under an act of a third address signal; the reference voltage switching circuit is used for outputting one gear of voltage among multiple gears of voltage under the act of a fourth address signal; and the logic operation unit is used for generating the third address signal and the fourth address signal according to a sequencing result through sequencing. The simulation signal detection system and simulation signal detection method can shorten the simulation signal detection time and reduces complexity of the system.
Description
technical field [0001] The invention relates to signal detection technology, in particular to an analog signal detection system and an analog signal detection method. Background technique [0002] In integrated circuits, with the continuous shrinking of the process size, more and more circuits are integrated on the chip, and the functions become more and more complex. The input / output ports (Input / Output, I / O) required for chip testing will also increase accordingly, and there are strict size restrictions between the input / output ports, and the number is very limited, which will cause great difficulties for chip testing. [0003] The existing analog signal amplitude detection is generally measured directly by connecting the analog signal to the input / output port, but with the increase of circuit complexity, the number of input / output ports is increasing, and the test time will increase with the number of signals. Increased by the increase, while increasing the complexity of...
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IPC IPC(8): G01R31/3167
CPCG01R31/3167
Inventor 黄正乙杨家奇黄正太王克涛郑荣乐
Owner SEMICON MFG INT (SHANGHAI) CORP