Imaging Particle Analysis Device

Abstract

The present invention relates to an imaging particle analyzing apparatus. More particularly, the present invention provides an imaging particle analyzing apparatus for analyzing particle characteristics such as the size and shape of the particles on the basis of an image of the particles photographed by a camera. To this end, the present invention provides an imaging particle analyzing apparatus comprising: a sample capillary into which the particles to be analyzed are injected; a stage on which the sample capillary is placed; a lower light source for irradiating light on the lower surface of the sample capillary; an optical system in which light is scattered by the particles on the sample capillary through which the light is transmitted as the sample capillary is irradiated with light from the lower light source and an image created by the scattered light is guided to the camera; a camera for photographing the scattered light image guided from the optical system for a specific time; and a computer for analyzing the particle characteristics using information inputted about the particles to be analyzed and the results of signal processing scattered light image frames photographed by the camera during a specific time.

Description

technical field [0001] The present invention relates to an imaging particle analysis device, in particular to an imaging particle analysis device. The device analyzes the particle size, Particle properties such as shape. Background technique [0002] The particle analyzer is a device for analyzing particle characteristics such as particle size and shape. Accurate determination of particle size is essential when using polymerization kinetics (particle formation, growth, and aggregation), and particle size analysis is used as important analytical information in grasping the physical, chemical, and mechanical properties of the final substance [0003] In the method for measuring nanometer-sized particles, in terms of the dynamic light scattering (Dynamic lightscattering, DLS) method, light is irradiated to nanoparticles by a laser (laser), and the degree of light scattering is measured, thereby measuring particle size. The disadvantage of the method is that it needs to be me...

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Problems solved by technology

[0005] Furthermore, in the case of DLS devices, the actual changes in the sample that occur in particle size determination cannot be observed, so there are fundamental constraints in understanding the phenomenon, and the limitation lies in the fact that samples that are affected by the laser light source (e.g., laser-decomposed samples, viable biota samples, etc.), analysis cannot be performed

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