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An inspection system and inspection device technology, applied in the field of inspection systems, can solve the problems of excessive time required for inspection, time-consuming and other problems

Active Publication Date: 2020-11-17
ORMON CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, in order to inspect the appearance of the entire circumference of the object, it takes time to move the robot including the camera and the lighting unit, and the inspection process becomes a huge amount, and the time required for the inspection exceeds the required time.

Method used

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Embodiment approach 1

[0029] figure 1 It is a schematic configuration diagram showing the inspection system according to the embodiment of the present invention. The inspection system has a robot 400 which is incorporated in a production line or the like. In the inspection system, objects (work W) placed in bulk on a pallet or the like are grasped (supported) by the robot 400 one by one and inspected.

[0030] refer to figure 1 , the inspection system includes a PLC (Programmable Logic Controller: Programmable Logic Controller) 100 , inspection units 200 and 300 connected to the PLC 100 , and a robot 400 . The inspection unit 300 is connected to the measurement device 350 , and the inspection unit 200 is connected to the imaging device 250 . The “control device” of the inspection system of the embodiment includes the inspection unit 200 , the inspection unit 300 , and the PLC 100 .

[0031] The inspection system includes: a processing device 500 for processing the workpiece W; a laser marking m...

Embodiment approach 2

[0097] In Embodiment 2, a modified example of Embodiment 1 will be described.

[0098] (measurement by image data)

[0099] In the above-described embodiment, the measurement device 350 is provided for measurement, but the measurement device 350 can be omitted when measurement data can be acquired from captured images. In Embodiment 2, for example, a 3D (three-dimensional) camera can be used as the imaging unit 255 to perform three-dimensional measurement of the workpiece W based on captured images. In this case, information on the surface height of the workpiece W can be detected from the 3D image output from the 3D camera. By comparing the 3D image data with 3D-CAD (computer-aided design: computer-aided design) data, it is possible to inspect the workpiece W for chipping / damage. Likewise, it is possible to generate a two-dimensional image from the 3D image data, and inspect the workpiece W for chipping / damage based on the generated two-dimensional image.

[0100] In addit...

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Abstract

The present invention provides an inspection system that shortens the time it takes to inspect an object. The inspection system includes: an inspection device for inspecting the appearance of an object; and a control device for controlling the inspection device. The inspection device includes: a substantially columnar first main body having a first through hole through which an object can pass; and a plurality of imaging units provided on an inner peripheral surface of the first main body forming the first through hole. The control device has an image processing unit that processes captured images output from the imaging units for inspection.

Description

technical field [0001] The invention relates to an inspection system, in particular to an inspection system for photographing inspection objects. Background technique [0002] In the FA (Factory Automation) field, etc., in the visual inspection of parts in the manufacturing process, semi-finished products, or products before shipment, some products are selected, and the operator inspects the entire circumference of the product for steps or damage. . If this inspection is performed for all products, there is a problem that the number of people and time are excessively consumed. [0003] In order to cope with this problem, there has been proposed a method of performing inspection using a device that combines an image sensor, a measurement sensor, and a robot. For example, Japanese Patent Application Laid-Open No. 2009-14696 discloses an appearance inspection device using a robot. In Patent Document 1, a camera and an illumination unit are attached to a robot in order to acq...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/88G01B11/00G06T7/00
CPCG01B11/105G01B11/2416G01N21/9515G01N21/952G01B11/14G01B11/245G01N21/8806G01N2021/8887G01N21/8851B25J9/0087G06T7/0004H04N7/181
Inventor 木村结贵松井明稻积伸悟
Owner ORMON CORP