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Sample table

A sample stage and sample technology, applied in the field of X-ray diffractometer, can solve the problems of deviation of test results, sample and reference plane are not on the same plane, and achieve the effect of ensuring accuracy

Pending Publication Date: 2018-01-30
SHENZHEN INST OF ADVANCED TECH
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

[0004] Although the existing design uses the XRD test of the sheet or block sample, the use of plasticine to support the sample will inevitably drop due to gravity during the test process, resulting in the sample and the reference plane not being on the same plane, and the test results are different. deviation

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Embodiment Construction

[0040] The technical solutions of the present invention will be clearly and completely described below in conjunction with the accompanying drawings. Apparently, the described embodiments are some of the embodiments of the present invention, but not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0041] In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer" etc. The indicated orientation or positional relationship is based on the orientation or positional relationship shown in the drawings, and is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the referred device or element must have a specific orientation, ...

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Abstract

The invention relates to the technical field of X-ray diffractometers, in particular to a sample table. The sample table comprises a mother seat, a platform and at least one pressing strip; a sample groove is formed in the mother seat; the platform is arranged in the sample groove; the pressing strip is arranged on the end surface, provided with the sample groove, of the mother seat, and is used for pressing a sample which is arranged in the sample groove; a jacking device is arranged on one side, far away from the pressing strip, of the platform, and is used for jacking the platform upwards so as to jack the sample on the platform. According to the sample table which is provided by the invention, the platform is arranged in the sample groove of the mother seat, and after the sample is placed on the platform, the sample is kept and pressed through the pressing strip, so that the sample supporting stability is kept, and the accuracy of a test result is ensured; the influence on a test result caused by the change of a sample position because of deformation influenced by the factors, such as gravity, of plasticine during testing is avoided.

Description

technical field [0001] The invention relates to the technical field of X-ray diffractometers, in particular to a sample stage. Background technique [0002] X-ray diffractometer technology (X-ray diffraction, XRD) is a research method that obtains information such as the composition of materials, the structure or morphology of atoms or molecules inside materials, and other information by performing X-ray diffraction on materials and analyzing their diffraction patterns. X-ray diffraction analysis is the main method to study the phase and crystal structure of substances. When a substance (crystalline or non-crystalline) is subjected to diffraction analysis, the substance is irradiated by X-rays to produce different degrees of diffraction phenomena, and the composition, crystal form, intramolecular bonding mode, molecular configuration, conformation, etc. unique diffraction pattern. The X-ray diffraction method has the advantages of no damage to the sample, no pollution, fas...

Claims

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Application Information

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IPC IPC(8): G01N23/20008
Inventor 唐永炳蒋春磊石磊
Owner SHENZHEN INST OF ADVANCED TECH
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