New power device control automatic electrostatic protection test system and method

A technology for controlling automation and power devices. It is used in the testing of single semiconductor devices, parts and instruments of electrical measuring instruments, etc. It can solve problems such as the inability to meet electrostatic reliability research and electrostatic protection design, and achieve easy manufacturing, debugging, and use. Flexible and stable effect

Inactive Publication Date: 2019-09-06
常州鼎先电子有限公司
View PDF10 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, this cannot meet the needs of electrostatic reliability research and electrostatic protection design

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • New power device control automatic electrostatic protection test system and method
  • New power device control automatic electrostatic protection test system and method
  • New power device control automatic electrostatic protection test system and method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0033] The present invention will be further described in detail below in conjunction with the drawings.

[0034] The invention provides a switch device and a switch control method of an electrostatic test system.

[0035] The switching device mainly utilizes the ability of the semiconductor power device to conduct the on-off of the electrical path under the control of the electrical signal. Compared with electromechanical switch devices such as high-speed / ultra-high-speed relays, semiconductor power devices as the switch of the test system have the characteristics of low price, good product consistency, fixed input and output impedance, long service life and rich product variety.

[0036] In the present invention, a part of the semiconductor power devices 11, 12, 13, 14 are respectively placed between the power supply 80 and the charging transmission line 31, 32, 33, 34, and the control signal is connected to the microprocessor 90; the other part of the semiconductor power devices 2...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a novel control automation type electrostatic protection test system and an electrostatic protection test method for power devices. According to the switch control device of the system, a plurality of semiconductor power devices are respectively arranged between a power supply and a charging transmission line, and the controls signals of the power devices are connected intoa microprocessor. Another plurality of semiconductor power devices are respectively arranged between the charging transmission line and a pulse propagation transmission line, and the controls signalsof the power devices are also connected into the microprocessor. According to the invention, the semiconductor power devices are adopted as the switch device of the system. In combination with a plurality of power device switch devices, a proper charging transmission line and a combination thereof are selected. Therefore, a pulse testing system with various pulse widths can be realized. Accordingto the system, the semiconductor power devices are used as the switch device to realize the multi-path control, so that the advantages of low cost, easy manufacture and debug, convenient maintenance,good stability, flexible usage and the like are realized. In combination with an automatic test system composed of a micro-controller, the system can be applied to the automatic testing of electrostatic protection and the like, and can completely meet the requirements of the multi-pulse width test.

Description

Technical field [0001] The invention relates to the field of electrostatic reliability testing in semiconductor reliability testing, in particular to a novel automatic system and method for measuring the electrostatic protection characteristics of semiconductor components. Background technique [0002] Electrostatic protection has always been a key research direction in semiconductor reliability. With the continuous advancement of semiconductor manufacturing processes, the risk of damage to integrated circuits caused by electrostatic discharge has received increasing attention. In the research of electrostatic reliability and electrostatic protection design, how to measure the electrostatic characteristics of the device under test is particularly important. [0003] In order to meet the needs of electrostatic reliability research, electrostatic protection design and evaluation of electrostatic protection level, all electrostatic protection phenomena are mainly divided into human bo...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/26G01R31/00G01R1/28G01R1/04G01R1/24
Inventor 姜一波董良威翟明静鲍静益葛云飞王玥汤洪波
Owner 常州鼎先电子有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap