A chip trimming circuit and trimming method

Abstract

The invention discloses a chip trimming circuit and a chip trimming method for solving the problem of relatively low precision of test parameters of chips due to unreliable trimming of the chips in the prior art. The chip trimming circuit comprises a trimming control module, a curing circuit module and an output circuit module, the curing circuit module comprises a first curing sub-module, a second curing sub-module and a burning control sub-module for controlling to burn the first curing sub-module and the second curing sub-module, the trimming control module is used for outputting a trimmingposition determined according to the test parameters of a chip to the curing circuit module, the curing circuit module is used for controlling the burning control sub-module to burn the first curingsub-module or the second curing sub-module according to the trimming position and converting the trimming position into a resistance change corresponding to the burnt curing sub-module after the burning, and the output circuit module is used for outputting a logic level signal according to the resistance change.

Description

technical field [0001] The present application relates to the field of circuit control, in particular to a chip trimming circuit and trimming method. Background technique [0002] With the development of integrated circuit design and process technology, the requirements for circuit performance in the chip production process are getting higher and higher. Due to the process deviation of the chip in the production process, there is a deviation between the performance index of the chip parameter and the expected parameter performance index, which affects the accuracy of the chip parameter. Some chip parameters may exceed the range required by the product specification, thus affecting If the yield rate of the chip is serious, the chip cannot be mass-produced. In order to improve the accuracy of the chip parameters and the yield rate of the chip, the chip parameters are usually tested during the production process of the chip or after the chip production is completed, and then t...

AI Technical Summary

Problems solved by technology

Since the fuse blowing process has requirements for the voltage, current and duration applied to the fuse, if the voltage, current and duration of the fuse are not well controlled, there will be a normal distribution of the impedance after the fuse is blown , therefore, the traditional fuse trimming has a certain probability of trimming errors

In addition, if the current or voltage selection of the blown fuse in the design is unreasonable, it will also lead to the situation that the fuse is not blown. If the fuse is not blown, the purpose of accurate trimming cannot be achieved, and the trimming result will even be worse.

Therefore, the traditional fuse trimming method is not ideal for trimming the test parameters of the chip, so it cannot improve the accuracy of the test parameters and the yield of the chip.

Images