An integrated operational amplifier AC open-loop magnification test system
A technology that integrates operational amplifiers and magnifications. It is used in electronic circuit testing and other directions. It can solve problems such as unstable working conditions and large magnifications, and achieve the effects of intuitive reading, improved measurement accuracy, and easy measurement operations.
Inactive Publication Date: 2019-09-27
NORTH CHINA ELECTRIC POWER UNIV (BAODING)
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Problems solved by technology
When integrating the open loop of the operational amplifier, due to the large magnification, it is likely to make the working state unstable, and the offset voltage, offset current, and drift must be considered
Method used
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[0022] The present invention will be described in detail below in combination with specific embodiments.
[0023] The system of the present invention is as figure 1 As shown, the output Vs of the multi-function signal voltage source 1 is connected to the negative input terminal A of the integrated operational amplifier 2 to be tested through the resistor R1, and the negative input terminal A of the integrated operational amplifier 2 to be tested is connected to the integrated operational amplifier 2 to be tested through the resistor R2 The output terminal Vo1 of the integrated operational amplifier 2 to be tested is connected to the analog input channel 1 of the data acquisition card 4, and the positive input terminal B of the integrated operational amplifier 2 to be tested is connected to the ground terminal of the power supply 5. In this way, the integrated operational amplifier 2 to be tested constitutes a negative feedback amplifier, and the amplification factor of the int...
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An integrated operational amplifier AC open-loop gain test system disclosed by the present invention is characterized in that a multifunctional signal voltage source is connected with a channel of a data acquisition card and one end of a resistor R1 separately, the other end of the resistor R1, one end of a resistor R2, a negative input end A of a to-be-tested integrated operational amplifier andthe negative input end C of a low-noise pre-amplifier are connected together, the other end of the resistor R2, the output end Vo1 of the to-be-tested integrated operational amplifier and the channel1 of the data acquisition card are connected together; the positive input end B of the to-be-tested integrated operational amplifier is grounded, the positive input end D of the low-noise pre-amplifier is grounded, and the output end Vo2 of the low-noise pre-amplifier is connected with the channel 2 of the data acquisition card; the data acquisition card is connected with a computer, the computercollects the data collected by the data acquisition card, and the AC open-loop gain of the operational amplifier is measured by a signal cross-correlation analyzing and processing software. The beneficial effects of the present invention are that the measurement precision of the AC open-loop gain of the operational amplifier is improved, the measurement operation is simple and convenient, and thereading is visual.
Description
technical field [0001] The invention belongs to the technical field of amplifier magnification testing, and relates to a system and method for measuring the AC open-loop magnification of an integrated operational amplifier working in a closed-loop state. Background technique [0002] In various activities of engineering technology, scientific research and production practice, the measurement of the AC open-loop magnification of integrated operational amplifiers is of great significance. Since the integrated op amp is used as a DC amplifier, most of it works under the action of an AC signal. Therefore, it is more practical to measure the AC open-loop gain. When integrating the open loop of the operational amplifier, due to the large magnification, it is likely to make the working state unstable, and the offset voltage, offset current, and drift must be considered. Therefore, the open-loop gain can be measured under the closed-loop condition during the measurement, which can...
Claims
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IPC IPC(8): G01R31/28
Inventor 田恬肖仕武
Owner NORTH CHINA ELECTRIC POWER UNIV (BAODING)