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Raw grain detector and detection light path system thereof

A technology for detecting optical paths and detectors, applied in instruments, analyzing materials, sorting, etc., can solve the problems of manual detection of imperfect grains of raw grains, low efficiency, and differences in the determination of grain grades of raw grains, and achieve high-precision and rapid detection.

Active Publication Date: 2018-03-13
HEFEI MEIYA OPTOELECTRONICS TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] However, manual detection of imperfect grains of raw grains takes a long time and is inefficient
Taking manual detection of wheat as an example, it takes 10 minutes to manually select imperfect kernels for 20g of wheat each time
Moreover, due to factors such as inspector skills, standards, and fatigue, there are certain differences in the grade determination of raw grain grains.

Method used

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  • Raw grain detector and detection light path system thereof
  • Raw grain detector and detection light path system thereof
  • Raw grain detector and detection light path system thereof

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Embodiment Construction

[0038] Embodiments of the invention are described in detail below, examples of which are illustrated in the accompanying drawings. The embodiments described below with reference to the accompanying drawings are exemplary, intended to explain the present invention, but not to be construed as limitations of the present invention, those skilled in the art can change the above-mentioned embodiments within the scope of the present invention , modification, substitution and variation.

[0039] In describing the present invention, it is to be understood that the terms "center", "upper", "lower", "front", "rear", "vertical", "horizontal", "top", "bottom", The orientations or positional relationships indicated by "inner", "outer", "axial", "radial", and "circumferential" are based on the orientations or positional relationships shown in the drawings, and are only for the convenience of describing the present invention and simplifying Describes, but does not indicate or imply that the ...

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Abstract

The invention discloses a raw grain detector and a detection light path system thereof. The detection light path system comprises a recognition device and a sight glass group for carrying out multisurface imaging on raw grain; the sight glass group comprises a plurality of sight glass modules; the sight glass modules are arranged on the same imaginative spherical surface in a spaced manner; a dropping path of the raw grain passes the sphere center of the imaginative spherical surface; each sight glass module faces towards the sphere center and is suitable for the imaging on the surfaces of theraw grain dropping to the sphere center; and the recognition device is connected with the sight glass group so as to receive imaging information of the sight glass group and obtain completeness information of the raw grain through analysis on the imaging information. According to the detection light path system, the multisurface imaging can be carried out on the raw grain and the completeness information can be obtained through analysis, and high precision and rapid detection on the raw grain can be realized.

Description

technical field [0001] The invention relates to the field of optoelectronic technology, more specifically, to a raw grain detector and its detection optical path system. Background technique [0002] In the links of grain storage, circulation, and processing, it is necessary to judge the grade of raw grain grains. In related technologies, the determination of the grade of raw grain grains is done manually, and quality inspectors randomly inspect the content of incomplete grains in the finished product to determine the grain grade. [0003] However, manual detection of imperfect grains of raw grains takes a long time and is inefficient. Taking manual detection of wheat as an example, it takes 10 minutes to manually select imperfect kernels for each sampling of 20g of wheat. Moreover, due to factors such as inspector skills, standards, and fatigue, there are certain differences in the grade determination of raw grain grains. Contents of the invention [0004] The present ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): B07C5/34B07C5/36G01N15/00
CPCB07C5/34B07C5/366G01N15/00
Inventor 井长龙李凯赵猛常宏
Owner HEFEI MEIYA OPTOELECTRONICS TECH