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Manufacturing method of embedded sample block and sample sheet

A manufacturing method and a technology of sample blocks, which are applied in the preparation, sampling, and measuring devices of test samples, can solve the problems of uneven production quality, large manpower and time costs, and inconsistent quality of observed samples, and achieve the goal of making The effect of consistent quality, time reduction and efficiency improvement

Active Publication Date: 2018-03-16
MATERIAL ANALYSIS TECH INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Therefore, when a large number of samples need to be observed, the sample preparation will consume a lot of manpower and time costs
In addition, the production quality of the single-made samples is uneven, which makes the quality of the observed samples inconsistent, which in turn affects the observed quality of the samples

Method used

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  • Manufacturing method of embedded sample block and sample sheet
  • Manufacturing method of embedded sample block and sample sheet
  • Manufacturing method of embedded sample block and sample sheet

Examples

Experimental program
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Effect test

Embodiment Construction

[0063] Figure 1A to Figure 1G is a schematic flowchart of a method for manufacturing an embedded sample block according to an embodiment of the present invention. Please refer to Figure 1A to Figure 1G , the manufacturing method of embedding sample block 100 comprises: providing support plate 120 (such as Figure 1A ). In this embodiment, the carrier 120 includes a carrier material layer 124 and a marking layer 126 . In addition, the carrier 120 can be disposed on the base 110, and the material of the base 110 is, for example, a silicon wafer. Next, if Figure 1AAs shown, a release layer 115 may be formed between the upper surface 112 of the base 110 and the carrier material layer 124 , so that the carrier material layer 124 is disposed on the base 110 through the release layer 115 .

[0064] In this embodiment, the release layer 115 is made of aluminum layer material, and the carrier material layer 124 is made of resin layer material, for example. However, in the presen...

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Abstract

A manufacturing method of an embedded sample block includes providing a carrier. The carrier has a sample accommodating area and a marking area. The sample accommodating area has a first groove and the marking area has second grooves. A sample is disposed in the first groove and a molding plate standing around the carrier is formed. The molding plate surrounds the sample accommodating area and themarking area and forms an opening exposing the sample, the first groove and the second grove. A molding material is formed inside the opening, such that the molding material covers the sample and isfilled into the first and second grooves. The molding material is solidified and the molding plate is removed to obtain the embedded sample block. In addition, a sample sheet sliced from the embeddedsample block is also mentioned.

Description

technical field [0001] The invention relates to a sample of an electron microscope, in particular to a method for manufacturing an embedded sample block of an electron microscope and a sample test piece. Background technique [0002] The high-resolution three-dimensional imaging technology of the electron microscope is applied to the analysis and detection applications of clinical medicine and biomolecular research, which can effectively increase the resolution of observation images and the accuracy of observation results. However, in the process of establishing a high-resolution 3D image, a large number of ultra-thin samples need to be prepared, and the image must be precisely positioned during the sample observation process. In the current process of preparing sample blocks for electron microscopes, most of them still need to use manual methods and use rubber tubes to carry out sample resin embedding one by one. Therefore, when a large number of samples need to be observe...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N1/28G01N1/36
CPCG01N1/286G01N1/36G01N2001/2873G01N2001/364G01N2001/366H01J37/26
Inventor 陈弘仁
Owner MATERIAL ANALYSIS TECH INC
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