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Flat-loaded probe device for high-speed flow field plasma parameter diagnosis

A plasma, high-speed flow field technology, used in measuring devices, testing of machine/structural components, instruments, etc.

Pending Publication Date: 2018-03-20
UNIV OF SCI & TECH OF CHINA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Aiming at the problem that the electrical probe cannot protrude from the surface of the flying object to detect plasma-related information, the present invention invents a flat-pack probe combined with the shape and structure of the flying object, including the size of the flat-pack probe, the insulating layer, and the linking method of the shape of the flying object

Method used

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  • Flat-loaded probe device for high-speed flow field plasma parameter diagnosis
  • Flat-loaded probe device for high-speed flow field plasma parameter diagnosis
  • Flat-loaded probe device for high-speed flow field plasma parameter diagnosis

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Embodiment Construction

[0024] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments.

[0025] The traditional electrostatic probe cannot accurately diagnose the plasma parameter information on the surface of the high-speed flying object due to the characteristic that the electrode is exposed outside the insulating sleeve. In order to solve this problem, we propose a design structure in which the surface of the probe electrode is flush with the surface of the insulating sleeve, and the probe with this special structure is called a flat-pack probe. This special electrode structure design concept well solves the problem that the electric probe cannot normally diagnose the plasma parameters in this special area.

[0026] figure 1 It is the flat-pack probe electrode diagram (the shaded part in the figure is the flat-pack probe electrode, the left is the side view of the electrode; the right is the front view of the electrode). The i...

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Abstract

The invention discloses a flat-loaded probe device for high-speed flow field plasma parameter diagnosis. The device comprises a flat-loaded probe. The flat-loaded probe aligns the surface of the probeelectrode with the surface of an insulating sleeve. The structure well solves the problems that in a high-speed flow field plasma, a traditional electrostatic probe is easily damaged in the flow field due to the exposed electrode, and the traditional electrostatic probe protrudes from the surface of a flying object and affects flight safety. In the high-speed flow field plasma environment, the flat-loaded probe can replace the electrostatic probe to better diagnose the parameter information of the plasma. According to the invention, the structure that the surface of the electrode is flush with the surface of the flying object is adopted; and the problem that the exposed electrode of a traditional Langmuir probe is easily insulated and damaged is successfully solved.

Description

technical field [0001] The invention belongs to the technical field of aerodynamic flow field diagnosis, and in particular relates to a flat-pack probe device used for diagnosis of plasma parameters in a high-speed flow field. Background technique [0002] The electrostatic probe was invented by Langmuir et al. in 1923. Due to its simple manufacture and high spatial resolution, it can accurately obtain the local plasma parameter information at the position of the probe, so it is widely used by researchers to diagnose plasma density. Information such as electron temperature and space potential. However, traditional electrostatic probes are not suitable for plasma information diagnosis in the environment of high-speed flow field. The plasma sheath is a typical high-speed flow field plasma; it is a high-density plasma thin layer formed on the surface of the flying object due to shock wave heating and protective material ablation after the high-speed re-entry flying object ente...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M9/06
CPCG01M9/065
Inventor 余鹏程徐亮张仲凯刘宇张逍曹金祥
Owner UNIV OF SCI & TECH OF CHINA
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