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A four-axis excitation device that can load impact loads on mems microstructures

A technology of impact load and excitation device, which is used in the testing of machine/structural components, measuring devices, impact testing, etc., can solve the problems of large parallelism error, inflexibility, increase in measurement result error, etc., and achieve accurate preloading. Force data, smooth adjustment process, effect of reducing shear force

Inactive Publication Date: 2019-07-02
BOHAI UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] 2. There is no direct connection between the upper connection block and the lower connection block and the sleeve, but are installed in the sleeve in turn by means of clearance fit. If the parallelism error of the two working surfaces of the stacked piezoelectric ceramics is large , there is not enough space to adjust the movable base structure;
[0006] 3. The pressure sensor is installed at the bottom of the lower connecting block. Since the movable base structure is self-adjusted, there is a certain inclination between the bottom of the lower connecting block and the working surface of the piezoelectric ceramic, so the pre-tightening force measured by the pressure sensor Or the output force of piezoelectric ceramics is not accurate; in addition, if the movable base structure causes the upper coupling block or the lower coupling block to contact the sleeve after adjustment, the error of the measurement result will further increase;
[0008] 5. In this device, gaskets of different thicknesses are used to change the magnitude of the pre-tightening force applied to the stacked piezoelectric ceramics, which leads to a complicated adjustment process and is not flexible enough

Method used

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  • A four-axis excitation device that can load impact loads on mems microstructures
  • A four-axis excitation device that can load impact loads on mems microstructures
  • A four-axis excitation device that can load impact loads on mems microstructures

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Embodiment Construction

[0040] Such as Figure 1 ~ Figure 7 As shown, the present invention relates to a four-axis excitation device that can load impact loads on MEMS microstructures. It includes a hollow sleeve 1 in which stacked piezoelectric ceramics 10, pressure sensors 11, and The movable base formed by the upper connecting block 13 and the lower connecting block 15 is provided with an elastic support 6 and a MEMS microstructure 4 on the sleeve 1.

[0041] An annular top plate 2 and a bottom plate 3 are respectively fixed on the upper and bottom surfaces of the sleeve 1 by bolts, and the MEMS microstructure 4 is mounted on the annular top plate 2 through an elastic support 6. The elastic support includes a square base plate 602 and four evenly distributed support arms 601. Each support arm 601 is composed of a first connecting arm 6011, a second connecting arm 6012, and a third connecting arm 6013 that are vertically connected to each other in turn. And the fourth connecting arm 6014, the four su...

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Abstract

The invention discloses a four-axis excitation device capable of applying impact loads to MEMS microstructures, comprising a sleeve, stacked piezoelectric ceramics, pressure sensors, upper and lower coupling blocks and MEMS microstructures; The supporting plate and the electric screw drive mechanism connected to the lower connecting block; the upper and lower connecting blocks are respectively provided with mutually matching spherical protrusions and spherical grooves; stacked piezoelectric ceramics are clamped between the pressure sensor and the elastic support The upper connection block is evenly connected with ball plungers, and the outer ends of the ball plungers push into the rectangular grooves on the inner wall of the sleeve. The device can flexibly apply different sizes of pre-tightening force to the stacked piezoelectric ceramics, and at the same time make the measured value of the pre-tightening force more accurate, and can make the adjustment process of compensating the parallelism error of the two working surfaces of the stacked piezoelectric ceramics easy. It is smoother and smoother, greatly reduces the shear force between the layers of the stacked piezoelectric ceramics, can avoid the falling off of the micro-device used for testing, and is convenient for testing the dynamic characteristic parameters of the MEMS microstructure.

Description

Technical field [0001] The invention belongs to the technical field of micro-mechanical electronic systems, and particularly relates to a four-axis excitation device that can load impact loads on MEMS microstructures. Background technique [0002] Because MEMS micro-devices have the advantages of low cost, small size and light weight, they have broad application prospects in many fields such as automobiles, aerospace, information communication, biochemistry, medical treatment, automatic control, and national defense. For many MEMS devices, the small displacements and small deformations of their internal microstructures are the basis for the realization of device functions. Therefore, accurate testing of the amplitude, natural frequency, damping ratio and other dynamic characteristics of these microstructures has become the development of MEMS products. important content. [0003] In order to test the dynamic characteristic parameters of the microstructure, the microstructure needs...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01M7/08
CPCG01M7/08
Inventor 佘东生于震魏泽飞赵辉伦淑娴刘闯
Owner BOHAI UNIV
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