An integrated circuit time parameter testing circuit and method

Abstract

The invention discloses a testing circuit and a testing method for time parameters of an integrated circuit. The testing circuit comprises a tested signal conditioning unit, wherein the tested signalconditioning unit is used for finishing an input waveform of a received tested signal outputted by the integrated circuit and then outputting the tested signal to a tested signal trigger unit; in thetested signal trigger unit, the finished tested signal is compared with a set start / stop signal trigger level by a comparison circuit and then the start / stop signal is outputted to a first start / stopsignal generating unit; the first start / stop signal generating unit is used for enabling the start / stop signal to generate trigger pulse for controlling a time measuring unit to measure the time parameters of the tested signal; a start / stop signal control unit is arranged between the first start / stop signal generating unit and the time measuring unit. According to the testing circuit and the testing method disclosed by the invention, the time measuring unit is controlled to start / stop shutoff and opening of a signal gate by setting proper trigger conditions, the test problem of the time parameters when the quality of the tested signal is imperfect can be solved, and test demands of complex time parameters are effectively met.

Description

technical field [0001] The invention belongs to the field of integrated circuit testing, and in particular relates to an integrated circuit time parameter testing circuit and method. Background technique [0002] As integrated circuit designers hope that the designed integrated circuits can meet the increasingly stringent requirements of users in terms of speed and response time, the test of time parameters is becoming more and more common and important. Most semiconductor automatic test equipment has its own time measurement module, which can be used to measure rise / fall time, period / frequency, duty cycle, transmission delay, etc. These time measurement modules receive the signal input to be tested, and after signal conditioning such as amplitude conversion, filtering, and comparator triggers, they generate start and stop signals for time measurement, which are input to the time measurement unit for testing. These time measurement modules can be competent when the test req...

AI Technical Summary

Problems solved by technology

[0003] The purpose of the present invention is to propose an integrated circuit time parameter test circuit and method to solve the problem of time parameter test when the test requirements become complicated, or when the signal quality is not ideal due to interference, impedance discontinuity and other factors

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