Check patentability & draft patents in minutes with Patsnap Eureka AI!

Semiconductor device structure

A device structure, semiconductor technology, applied in the relative position of the gate stack structure, contact electrode, semiconductor wire field, can solve the problem of incomplete application and so on

Inactive Publication Date: 2018-06-05
TAIWAN SEMICON MFG CO LTD
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

These newer classes of semiconductor integrated circuit devices present process challenges and are not fully applicable in all respects

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Semiconductor device structure
  • Semiconductor device structure
  • Semiconductor device structure

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0050] Different embodiments or examples provided below may implement different structures of the present disclosure. The examples of specific components and arrangements are used to simplify the disclosure and not to limit it. For example, the statement that the first component is formed on the second component includes that the two are in direct contact, or there are other additional components interposed between the two instead of direct contact. In addition, numbers may be repeated in various examples of the present disclosure, but these repetitions are only for simplification and clarity of illustration, and do not mean that units with the same numbers in different embodiments and / or arrangements have the same corresponding relationship.

[0051] In addition, spatial relative terms such as "beneath", "beneath", "below", "above", "above", or similar terms may be used to simplify the relationship between one element and another element in the illustrations. relative relati...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The embodiment of the invention provides a semiconductor device structure. The semiconductor device structure includes a dielectric layer. The semiconductor device structure also includes a gate stackstructure in the dielectric layer. The semiconductor device structure further includes a semiconductor wire partially surrounded by the gate stack structure. In addition, the semiconductor device structure includes a contact electrode in the dielectric layer and electrically connected to the semiconductor wire. The contact electrode and the gate stack structure extend from the semiconductor wirein opposite directions.

Description

technical field [0001] Embodiments of the present disclosure relate to the structure of a semiconductor device, and more particularly to the relative positions of semiconductor lines, contact electrodes, and gate stack structures thereof. Background technique [0002] The semiconductor integrated circuit industry has experienced rapid growth. Technological advances in integrated circuit materials and design have produced successive generations of integrated circuits. Each generation of integrated circuits has smaller and more complex circuits than the previous generation. [0003] In the evolution of integrated circuits, functional density (such as the number of interconnection devices per unit chip area) usually increases as the geometry size (the smallest component or circuit that can be formed by a process) shrinks. Process downscaling is often beneficial in increasing throughput and reducing associated costs. [0004] Dimensional scaling has also increased the process...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H01L29/775
CPCH01L29/401H01L29/775B82Y10/00H01L21/76224H01L21/823412H01L27/088H01L29/0673H01L29/0692H01L29/41733H01L29/42376H01L29/42384H01L29/66439H01L29/78696H01L21/02636H01L21/30604H01L29/41775H01L29/42316H01L29/7845
Inventor 萧锦涛曾健庭杨超源许义明郑存甫王薏涵
Owner TAIWAN SEMICON MFG CO LTD
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More