BIT (built-in test) intermittent-fault diagnosis method based on sparse representation

Abstract

The invention discloses a BIT (built-in test) intermittent-fault diagnosis method based on sparse representation. The method specifically includes the following steps: (1) collecting different equipment history BIT data of which types include a normal data type, an intermittent-fault data type and a permanent-fault data type, selecting 70% of data from each data type to use the same as a trainingsample set, and removing labels of the remaining data to use the same as a test sample set; (2) utilizing a k-singular-value-decomposition (K-SVD) learning algorithm to carry out learning training onthe training sample set, and constructing an overcomplete dictionary D; (3) utilizing the overcomplete dictionary D to carry out sparse representation on the obtained test sample set to obtain sparsecoefficients; (4) utilizing a sparse representation classifier (SRC) to carry out sparse reconstruction on the sparse coefficients to obtain reconstruction residuals; and (5) categorizing to-be-testedsamples into categories of smallest reconstruction residuals, and thus obtaining diagnosis results of to-be-tested BIT data. The method can highly effectively and accurately diagnose BIT intermittent-faults, has higher diagnosis precision, and decreases a BIT false-alarm rate.

Description

technical field [0001] The invention relates to the technical field of intermittent fault diagnosis based on pattern recognition, in particular to a BIT intermittent fault diagnosis technology based on sparse representation. Background technique [0002] Since the late 1970s, built-in test (BIT) technology has been used as a very practical fault diagnosis technology. Experts and scholars at home and abroad have done a lot of research in theory, and have also made great achievements in practical application. Great results. This technology is now widely used in various industries, especially in aviation systems and weaponry. At present, almost all military and civil aircraft avionics systems and weapons in the United States have BIT. This technology has played an important role in improving system test performance, simplifying maintenance process and reducing maintenance costs. At present, in my country, BIT has also become one of the design and development projects of miss...

AI Technical Summary

Problems solved by technology

Intermittent faults are usually generated under conditions such as extreme environments, weak soldering in circuits, or grid fluctuations. They can be recovered within a limited time without repairs. They are characterized by strong randomness and short duration. If they cannot be diagnosed in time identified, will lead to BIT false alarm

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