In-situ electrical sample rod system for transmission electron microscope

Abstract

The invention relates to the field of in-situ measurement and research of a transmission electron microscope accessory and a low-dimensional material, and in particular to an in-situ electrical samplerod system for a transmission electron microscope. The system comprises a high-vacuum round airtight connector, a hollow sample rod framework, a wire, a ceramic heating sheet, a thermosensitive resistor, a temperature control unit and a heating chip, wherein the high-vacuum round airtight connector is used for conducting an electrical signal, a surface of the hollow sample rod framework is insulated, the wire is arranged in the sample rod framework, the thermosensitive resistor and the ceramic heating sheet are integrated with a miniature sample table, are connected with the round airtight connector and an external circuit unit by the wire and are used for monitoring a heating temperature, a heating rate and temperature stability of the miniature sample table, and the heating chip is placed on the miniature sample table and can be used for controlling a temperature of a sample micro region. By the system, the atomic dimension measurement and research of macro performance of the material in a vacuum environment and under heating and electrical field conditions is achieved to the greatest extent, and the system is widely used for researching high-temperature phase change, electricalproperty, thermoelectric performance, chemical reaction and the like.

Description

Technical field [0001] The invention relates to the field of transmission electron microscope accessories and in-situ measurement of low-dimensional materials, in particular to an in-situ electrical sample rod system for transmission electron microscopes. Background technique [0002] The structural changes of the material on the sub-nanometer or atomic scale caused by the coupling of the surrounding environment and multi-physics external fields are the root of its macroscopic properties, and whether the material under the action of the environment and external fields can be observed on the sub-nanometer or atomic scale The evolution of structure or chemical composition has become the key to understanding material properties. The in-situ, real-time high-resolution characterization technology of nanoscale structures and properties under the action of the environment and external fields directly determines our cognitive ability of materials, which is the realization of material str...

AI Technical Summary

Problems solved by technology

However, it is technically difficult to design and manufacture the in-situ simulation environment and multi-field coupling function sample rod system, and the key technologies and core patents are in the hands of foreign companies. Imported by the company, the price is very expensive, accounting for almost half of the price of transmission electron microscopy, which seriously hinders the promotion and use of in-situ transmission electron microscopy characterization technology in my country

The more prominent problem is that the function of the in-situ sample rod system imported from my country is limited, and there is no responsive customization, so it is difficult to change according to the needs of scientific research tasks

Moreover, it can only be imported into the simulated vacuum environment and the in-situ sample rod system with simple thermal and electric external field functions, which is far from meeting the complex and changeable research requirements, and greatly restricts the development of my country's in-situ TEM characterization technology. , not only the content of scientific research is limited, but more importantly, the ability to conduct original research and technology accumulation are lost. Having original scientific research equipment is the prerequisite, basis and strongest guarantee for obtaining original scientific research results

Due to technical limitations, there is no mature commercial TEM sample rod system that can simultaneously realize in-situ heating and power-on functions at home and abroad, and the heating function of the in-situ sample rod exists for high-temperature sample composition analysis (Energy Dispersive Spectroscopy, EDS) has poor accuracy and low anti-interference ability. Based on this appeal and the applicant's solid work foundation in this field for many years, the present invention maximizes the macroscopic analysis of materials in a vacuum environment and under heating and power-on external field conditions. Atomic scale measurement and research of performance, widely used in exploring various high-temperature phase transitions, electrical properties, thermoelectric properties, chemical reactions, etc.

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