Test system for clock chip and test method thereof

Abstract

The invention provides a test system for clock chip and a test method thereof; the test system comprises a microcontroller, a counter and a high-speed clock source; the microcontroller is used for writing test logic into a to-be-tested clock chip and setting the to-be-tested clock chip so as to interrupt the output alarm of the to-be-tested clock chip; the counter is used for calculating the period of alarm interruption generated by the to-be-tested clock chip; the high-speed clock source is used for generating clock pulse signal to replace a to-be-tested clock source; and the frequency of thehigh-speed clock source is greater that that of the to-be-tested clock source. The test method comprises test timing logic and test timing precision. According to the test system for clock chip and the test method thereof, the test timing logic and the test timing precision can be achieved with one test system, which is conductive to reducing test cost and improving cost performance.

Description

technical field [0001] The invention relates to the field of clock circuits, in particular to a clock chip testing system and a method for testing the timing logic and timing accuracy of the clock chip. Background technique [0002] Clock circuits are widely used in various fields. When the clock chip in the clock circuit is pressed, dropped, or exposed to static electricity during use, logic anomalies may occur, such as seconds or minutes going from 0 to 59. During the process, there are phenomena such as jumping seconds, jumping minutes, or circular timing within a certain period of time. If a logical anomaly occurs in the counting of years and months, it will take years or months to show up. If the clock chip with abnormal logic cannot be detected in a short period of time, it will cause great product hidden dangers. [0003] In addition, the timing error of the clock chip is mainly affected by the frequency error of the chip crystal, and the change of temperature will a...

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Problems solved by technology

[0004] The purpose of the present invention is to solve the problem that the prior art cannot detect the clock chip with abnormal logic in a short time and the timing accuracy of the clock chip cannot be tested at different temperatures, and propose a clock chip test system and its test method

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