Analytical method and device of organic outer insulation surface appearance
A surface topography and analysis method technology, applied in the field of power systems, can solve problems such as large errors, insufficient surface topography structure, and lack of characterization methods for organic external insulation surface topography
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[0124] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0125] Such as figure 1 As shown, the embodiment of the present invention provides a method for analyzing the surface morphology of organic outer insulation, including:
[0126] Step 1. The sample of the organic outer insulating surface to be analyzed is scanned and measured by an atomic force microscope, and the scanning data of the organic outer insulating surface within a measurement size is obtained.
[0127] The atomic force microscope can use the MFP at...
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