Unlock instant, AI-driven research and patent intelligence for your innovation.

Semiconductor device forming method

A manufacturing method, semiconductor technology, applied in the direction of semiconductor/solid-state device manufacturing, semiconductor devices, electrical components, etc.

Active Publication Date: 2018-06-29
TAIWAN SEMICON MFG CO LTD
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, as the size of the smallest components shrinks, additional issues arise in every process used that should be overcome

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Semiconductor device forming method
  • Semiconductor device forming method
  • Semiconductor device forming method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0037] The following disclosure provides many different embodiments, or examples, for implementing different components of embodiments of the disclosure. Specific examples of components and their arrangement are described below to simplify the embodiments of the present disclosure. Of course, these are just examples, and are not intended to limit the protection scope of the embodiments of the present disclosure. For example, in the following description, forming a first part on or on a second part may include an embodiment in which the first part and the second part are formed in direct contact, and may also include an embodiment in which the first part and the second part are formed. An embodiment in which an additional part is formed between parts such that the first part and the second part may not be in direct contact. In addition, the embodiments of the present disclosure may repeat reference numerals and / or letters in various examples. This repetition is for the purpos...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A semiconductor device forming method includes: forming a gate stack over a substrate; growing a source / drain region adjacent the gate stack, wherein the source / drain region being n-type doped Si; growing a semiconductor cap layer over the source / drain region, the semiconductor cap layer having Ge impurities, the source / drain region are free of the Ge impurities; depositing a metal layer over thesemiconductor cap layer; annealing the metal layer and the semiconductor cap layer to form a silicide layer over the source / drain region, wherein the silicide layer having the Ge impurities; and forming a metal contact electrically coupled to the silicide layer.

Description

technical field [0001] Embodiments of the present disclosure relate to semiconductor technology, and in particular to the structure of a semiconductor device and its manufacturing method. Background technique [0002] Semiconductor devices are used in various electronic applications such as personal computers, cell phones, digital cameras, and other electronic equipment. Semiconductor devices are usually manufactured by sequentially depositing insulating or dielectric layers, conductive layers and semiconducting layers of materials on a semiconductor substrate, and patterning the various material layers using photolithography and etching processes to form circuit components and components on the semiconductor substrate. [0003] The semiconductor industry continuously improves the integration density of various electronic components (such as transistors, diodes, resistors, capacitors, etc.) by continuously reducing the size of the smallest components, so that more component...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H01L21/336H01L29/78
CPCH01L29/665H01L29/66795H01L29/785H01L21/823814H01L29/66545H01L29/7848H01L21/28518H01L21/76843H01L21/76855H01L29/7851H01L29/45H01L29/41791H01L29/66878H01L21/823431H01L21/823418H01L21/76889H01L21/02532H01L21/76802
Inventor 沙哈吉·B·摩尔潘正扬张世杰李承翰
Owner TAIWAN SEMICON MFG CO LTD