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Magnetometer error correction method and device, magnetometer measuring device

A technology of error correction and magnetometer, which is applied in the direction of measuring devices, magnetic measurement environment, and measurement of electric variables, etc., can solve problems such as not completely ideal symmetry, nonlinear results, etc.

Inactive Publication Date: 2020-06-30
RESEARCH INSTITUTE OF TSINGHUA UNIVERSITY IN SHENZHEN
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

The asymmetry of the circuit affects the output results. Usually, whether it is a digital circuit AD or an analog circuit amplifier, it is not completely ideally symmetrical, and the output results have serious nonlinearity.

Method used

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  • Magnetometer error correction method and device, magnetometer measuring device
  • Magnetometer error correction method and device, magnetometer measuring device
  • Magnetometer error correction method and device, magnetometer measuring device

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Embodiment Construction

[0074] In order to more clearly understand the above objects, features and advantages of the embodiments of the present invention, the present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments. It should be noted that, in the case of no conflict, the features in the embodiments of the present application may be combined with each other.

[0075] In the following description, a lot of specific details are set forth in order to fully understand the embodiments of the present invention, and the described implementations are part of the implementations of the present invention, but not all of the implementations. Based on the implementation manners in the present invention, all other implementation manners obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the embodiments of the present invention.

[0076] Unless defined otherwise, all technical and scie...

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Abstract

The invention provides a magnetometer error correction method. The method comprises the following steps of measuring and calculating the nonlinear correction coefficient of each measuring shaft of a magnetometer; adjusting a probe temperature, and according to the nonlinear correction coefficient, calculating the probe temperature correction coefficient of each measuring shaft of the magnetometer;adjusting a circuit temperature, and according to the nonlinear correction coefficient, calculating the circuit temperature correction coefficient of each measuring shaft of the magnetometer; using the nonlinear correction coefficient, the probe temperature correction coefficient and the circuit temperature correction coefficient to correct the direct measuring value of each measuring shaft of the magnetometer; and carrying out orthonormal correction on the corrected direct measuring value of each measuring shaft, and acquiring the magnetic-field component of each measuring shaft of the magnetometer. The invention also provides a magnetometer error correction device and a magnetic strength measuring device. In the invention, nonlinearity between magnetometer output and a real magnetic field can be optimized and the linearity of the magnetometer can be increased.

Description

technical field [0001] The invention relates to the technical field of magnetic field measurement, in particular to a magnetometer error correction method and device, and a magnetometer measuring device. Background technique [0002] This section is intended to provide a background or context for the implementation of the embodiments of the invention that are set forth in the claims and detailed description. The descriptions herein are not admitted to be prior art by inclusion in this section. [0003] A magnetometer is an instrument used to measure magnetic fields. The three-axis directions of the existing magnetometer probes are not perfectly orthogonal to each other, which causes errors in the measurement direction. Usually, special hardware corrections are added to the probes. The device performs three-axis orthogonality correction, which has poor seismic performance and increases the size and weight of the probe. The temperature of the probe has a great influence on t...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R35/00G01R33/02
CPCG01R33/0082G01R33/02G01R35/005
Inventor 陈曦巩永稳张金龙靳瑾匡麟玲
Owner RESEARCH INSTITUTE OF TSINGHUA UNIVERSITY IN SHENZHEN